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MCP3910 датащи(PDF) 62 Page - Microchip Technology

номер детали MCP3910
подробное описание детали  3V Two-Channel Analog Front End
PDF  90 Pages
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производитель  MICROCHIP [Microchip Technology]
домашняя страница  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP3910 датащи(HTML) 62 Page - Microchip Technology

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MCP3910
DS20005116D-page 62
 2012-2020 Microchip Technology Inc.
8.5
Differential Inputs Anti-Aliasing
Filter
Due to the nature of the ADCs used in the MCP3910
(oversampling converters), each differential input of the
ADC channels requires an anti-aliasing filter so that the
oversampling frequency (DMCLK) is largely attenuated
and does not generate any disturbances on the ADC
accuracy. This anti-aliasing filter also needs to have a
gain close to the one in the signal bandwidth of interest.
Typically for 50/60 Hz measurement and default set-
tings (DMCLK = 1 MHz), a simple RC filter with 1 k
and 100 nF can be used. The anti-aliasing filter used
for the measurement graphs is a first-order RC filter
with 1 k
 and 15 nF. The typical schematic for connect-
ing a current transformer to the ADC is shown in
Figure 8-6. If wires are involved, twisting them is also
recommended.
FIGURE 8-6:
First-Order Anti-Aliasing
Filter for CT-Based Designs.
The di/dt current sensors, such as Rogowski coils, can
be an alternative to current transformers. Since these
sensing elements are highly sensitive to high-
frequency electromagnetic fields, using a second-order
anti-aliasing filter is recommended to increase the
attenuation of potential perturbing RF signals.
FIGURE 8-7:
Second-Order Anti-Aliasing
Filter for Rogowski Coil-Based Designs.
The filter presented in Figure 8-7 is an anti-aliasing
filter. The di/dt integrator can be created in firmware as
a first-order low-pass filter with corner frequency much
lower than the input signal.
The MCP3910 is highly recommended in applications
using di/dt as current sensors because of the extremely
low noise floor at low frequencies. In such applications,
a Low-Pass Filter (LPF) with a cutoff frequency much
lower than the signal frequency (50-60 Hz for metering)
is used to compensate for the 90-degree shift and for the
20 db/decade attenuation induced by the di/dt sensor.
Because of this filter, the SNR will be decreased, since
the signal will attenuate by a few orders of magnitude,
while the low-frequency noise will not be attenuated.
Usually, a high-order High-Pass Filter (HPF) is used to
attenuate the low-frequency noise in order to prevent a
dramatic degradation of the SNR, which can be very
important in other parts. A high-order filter will also con-
sume a significant portion of the computation power of
the MCU. When using the MCP3910, such a high-order
HPF is not required, since this part has a low noise floor
at low frequencies. A first-order HPF is enough to
achieve very good accuracy.
8.6
Energy Measurement Error
Considerations
The measurement error is a typical representation of
the nonlinearity of a pair of ADCs (see Section 4.0
“Terminology and Formulas”
for the definition of
measurement error). The measurement error is depen-
dent on the THD and on the noise floor of the ADCs.
Improving the measurement error specification on the
MCP3910 can be realized by increasing the OSR (to get
a better SINAD and THD performance) and, to some
extent, the boost settings (if the bandwidth of the
measurements is too limited by the bandwidth of the
amplifiers in the Sigma-Delta ADCs). In most of the
energy metering AC applications, High-Pass Filters are
used to cancel the offset on each ADC channel (current
and voltage channels), and therefore, a single-point
calibration is necessary to calibrate the system for active
energy measurement. This calibration is a system gain
calibration and the user can utilize the EN_GAINCAL bit
and the GAINCAL_CHn registers to perform this digital
calibration. After such calibration, typical measurement
error curves, such as in Figure 2-7, can be generated by
sweeping the current channel amplitude and measuring
the energy at the outputs (the energy calculations here
are being realized off-chip). The error is measured using
a gain of 1x, as it is commonly used in most CT-based
applications.



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