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DSP56166ROM датащи(PDF) 13 Page - Motorola, Inc |
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DSP56166ROM датащи(HTML) 13 Page - Motorola, Inc |
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13 / 63 page ![]() PRELIMINARY - 6/15/93 3 DSP56166 Technical Data Sheet MOTOROLA Power Considerations The average chip junction temperature, TJ, in °C can be obtained from: TJ = TA + (PD*ΘJA) (1) Where: TA = Ambient Temperature, °C Θ JA = Package Thermal Resistance, Junction-to-Ambient, °C/W PD = PINT + PI/O PINT = ICC*Vdd, Watts — Chip Internal Power PI/O = Power Dissipation on Input and Output Pins — User Determined For most applications PI/O < PINT and can be neglected. An appropriate relationship between PD and TJ (if PI/O is neglected) is: PD = K/(TJ + 273° C) (2) Solving equations (1) and (2) for K gives: K = PD*(TA + 273° C) + ΘJA*PD (3) Where K is a constant pertaining to the particular part. K can be determined from equation (2) by measuring PD (at equilibrium) for a known TA. Using this value of K, the values of PD and TJ can be obtained by solving equations (1) and (2) iteratively for any value of TA. The total thermal resistance of a package (ΘJA) can be separated into two components, Θ JA and CA, representing the barrier to heat flow from the semiconductor junction to the package (case) surface ( Θ JC) and from the case to the outside ambient (CA). These terms are related by the equation: Θ JA = ΘJC + CA (4) Θ JC is device related and cannot be influenced by the user. However, CA is user dependent and can be minimized by such thermal management techniques as heat sinks, ambient air cooling, and thermal con- vection. Thus, good thermal management on the part of the user can significantly reduce CA so thatΘJA ap- proximately equals Θ JC. Substitution of ΘJC for ΘJA in equation (1) will result in a lower semiconductor junc- tion temperature. Values for thermal resistance presented in this document, unless estimated, were derived using the procedure described in Motorola Reliability Report 7843, “Thermal Resistance Measurement Method for MC68XX Microcomponent Devices”, and are provided for design purposes only. Thermal mea- surements are complex and dependent on procedure and setup. User—derived values for thermal resis- tance may differ. |
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