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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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PC87351 датащи(PDF) 75 Page - National Semiconductor (TI) |
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PC87351 датащи(HTML) 75 Page - National Semiconductor (TI) |
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75 / 86 page  11.0 Device Characteristics (Continued) 75 www.national.com 11.2 AC ELECTRICAL CHARACTERISTICS 11.2.1 AC Test Conditions Figure 11-1. AC Test Conditions, TA = 0 °C to 70 °C, VDD = 5.0 V ±10% Notes: 1. CL = 100 pF, includes jig and scope capacitance. 2. S1 = Open for push-pull output pins. S1 = VDD for high impedance to active low and active low to high impedance measurements. S1 = GND for high impedance to active high and active high to high impedance measurements. RL = 1.0KΩ for µP interface pins. For the FDC open-drive interface pins, S1 = VDD and RL = 150Ω 11.2.2 Clock Timing . 1. Not tested. Guaranteed by design. Symbol Parameter 48MHz Min Max Unit tCH Clock High Pulse Width1 8.4 nsec tCL Clock Low Pulse Width1 8.4 nsec tCP Clock Period 1 20 21.5 nsec Device Under Test 0.1 µf Input Output RL CL S1 Load Circuit (Notes 1, 2, 3) AC Testing Input, Output Waveform VDD 2.4 0.4 2.0 0.8 Test Points 2.0 0.8 CLKIN tCL tCP tCH |
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