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LPC1547JBD48 датащи(PDF) 79 Page - NXP Semiconductors |
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LPC1547JBD48 датащи(HTML) 79 Page - NXP Semiconductors |
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79 / 99 page ![]() LPC15XX All information provided in this document is subject to legal disclaimers. © NXP B.V. 2014. All rights reserved. Product data sheet Rev. 1 — 19 February 2014 79 of 99 NXP Semiconductors LPC15xx 32-bit ARM Cortex-M3 microcontroller [1] Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply voltages. Table 25. DAC static and dynamic characteristics VDDA = 2.4 V to 3.6 V; Tamb = 40 C to +105 C unless otherwise specified; CL = 100 pF; RL =10 k.. Symbol Parameter Conditions Min Typ [1] Max Unit fc(DAC) DAC conversion frequency - - 500 kSamples/s RO output resistance - 300 ts settling time - - 2.5 s ED differential linearity error -- +/-0.4 LSB EL(adj) integral non-linearity -- +/-3 LSB EO offset error VDDA = 3.3 V - - +/-9 LSB VDDA = 2.4 V - - +/-8 LSB EG gain error - - +/- 0.1 % VO output voltage Output voltage range with less than 1 LSB deviation; with minimum RL connected to ground or power supply -- VDDA - 0.3 V Fig 41. DAC test circuit DAC 10 kΩ DVM LPCxxxx RL aaa-011964 |
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