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352 датащи(PDF) 82 Page - Intel Corporation |
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352 датащи(HTML) 82 Page - Intel Corporation |
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82 / 95 page ![]() Thermal Specifications and Design Considerations 82 Datasheet temperature. Transistor Model parameters (Table 31) have been added to support thermal sensors that use the transistor equation method. The Transistor Model may provide more accurate temperature measurements when the diode ideality factor is closer to the maximum or minimum limits. This thermal "diode" is separate from the Thermal Monitor's thermal sensor and cannot be used to predict the behavior of the Thermal Monitor. NOTES: 1. Intel does not support or recommend operation of the thermal diode under reverse bias. 2. Characterized across a temperature range of 50 - 80 °C. 3. Not 100% tested. Specified by design characterization. 4. The ideality factor, n, represents the deviation from ideal diode behavior as exemplified by the diode equation: IFW = IS * (e qV D /nkT –1) where IS = saturation current, q = electronic charge, VD = voltage across the diode, k = Boltzmann Constant, and T = absolute temperature (Kelvin). 5. The series resistance, RT, is provided to allow for a more accurate measurement of the junction temperature. RT, as defined, includes the lands of the processor but does not include any socket resistance or board trace resistance between the socket and the external remote diode thermal sensor. RT can be used by remote diode thermal sensors with automatic series resistance cancellation to calibrate out this error term. Another application is that a temperature offset can be manually calculated and programmed into an offset register in the remote diode thermal sensors as exemplified by the equation: Terror = [RT * (N-1) * IFWmin] / [nk/q * ln N] where Terror = sensor temperature error, N = sensor current ratio, k = Boltzmann Constant, q = electronic charge. NOTES: 1. Intel does not support or recommend operation of the thermal diode under reverse bias. 2. Same as IFW in Table 30 3. Characterized across a temperature range of 50 – 80 °C. 4. Not 100% tested. Specified by design characterization. 5. The ideality factor, nQ, represents the deviation from ideal transistor model behavior as exemplified by the equation for the collector current: IC = IS * (e qV BE /n Q kT –1) Where IS = saturation current, q = electronic charge, VBE = voltage across the transistor base emitter junction (same nodes as VD), k = Boltzmann Constant, and T = absolute temperature (Kelvin). 6. The series resistance, RT, provided in the Diode Model Table (Table 30) can be used for more accurate readings as needed. Table 30. Thermal “Diode” Parameters using Diode Model Symbol Parameter Min Typ Max Unit Notes IFW Forward Bias Current 5 — 200 µA 1 n Diode Ideality Factor 1.000 1.009 1.050 - 2, 3, 4 R T Series Resistance 2.79 4.52 6.24 Ω 2, 3, 5 Table 31. Thermal “Diode” Parameters using Transistor Model Symbol Parameter Min Typ Max Unit Notes IFW Forward Bias Current 5 — 200 µA 1, 2 IE Emitter Current 5 — 200 µA nQ Transistor Ideality 0.997 1.001 1.005 3, 4, 5 Beta 0.391 — 0.760 3, 4 R T Series Resistance 2.79 4.52 6.24 Ω 3, 6 |
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