HT45F75 datasheet(11/190 Pages) HOLTEK

11 / 190 page

Rev. 1.10

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Rev. 1.10

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HT45F75

Body Fat Scale Flash MCU

HT45F75

Body Fat Scale Flash MCU

Pin Name

Function

OPT

I/T

O/T

Descriptions

CP0N

—

Peak Dete�to� Input

RFC

—

ADC Analog Input

VOUT/AVDD

VOUT

—

PWR LDO Output pin

AVDD

—

PWR

—

Analog Powe� Supply

AVSS

—

PWR

—

Analog G�ound

VCM

—

PWR ADC Inte�nal Co��on Mode Voltage Output

VERFP

—

PWR

—

ADC Positive Refe�en�e Input (Exte�nal)

VERFN

—

PWR

—

ADC Negative Refe�en�e Input (Exte�nal)

AN0~AN3

ANn

—

ADC Input Channel 0~3

VDD

—

PWR

—

Digital Powe� supply

VSS

—

PWR

—

Digital G�ound

Note:I/T:Inputtype;

O/T:Outputtype;

OTP:Optionalbyconfigurationoption(CO)orregisteroption;

PWR:Power;

CO:Configurationoption;

ST:SchmittTriggerinput;

CMOS:CMOSoutput;

AI:Analoginput;

AO:Analogoutput;

HXT:Highfrequencycrystaloscillator;

LXT:Lowfrequencycrystaloscillator.

Absolute Maximum Ratings

SupplyVoltage.................................................................................................. VSS-0.3VtoVSS+6.0V

InputVoltage......................................................................................................VSS-0.3VtoVDD+0.3V

StorageTemperature..................................................................................................... -50°Cto125°C

OperatingTemperature....................................................................................................-40°Cto85°C

IOLTotal...................................................................................................................................... 150mA

IOHTotal.....................................................................................................................................-100mA

TotalPowerDissipation............................................................................................................ 500mW

Note:Thesearestressratingsonly.Stressesexceedingtherangespecifiedunder“Absolute

MaximumRatings”maycausesubstantialdamagetothedevice.Functionaloperationofthis

deviceatotherconditionsbeyondthoselistedinthespecificationisnotimpliedandprolonged

exposuretoextremeconditionsmayaffectdevicereliability.

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