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PC87365 датащи(PDF) 206 Page - National Semiconductor (TI) |
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PC87365 датащи(HTML) 206 Page - National Semiconductor (TI) |
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206 / 215 page ![]() 12.0 Device Characteristics (Continued) 206 www.national.com 12.5 AC ELECTRICAL CHARACTERISTICS 12.5.1 AC Test Conditions Figure 41. AC Test Conditions, TA =0 °Cto70 °C, VDD = 5.0V ±10% Notes: 1. CL = 100 pF for all output pins except OPCI, and CL = 50pF for outputs of type OPCI. These values include both jig and scope capacitance. 2. S1 = Open for push-pull output pins. S1 = VDD for high impedance to active low and active low to high-impedance measurements. S1 = GND for high impedance to active high and active high to high-impedance measurements. RL = 1.0KΩ for µP interface pins. 3. For the FDC open-drive interface pins, S1 = VDD and RL = 150Ω. 12.5.2 Clock Timing . Symbol Parameter 48 MHz Min Max Unit tCH Clock High Pulse Width1 1. Not tested. Guaranteed by design. 8.4 ns tCL Clock Low Pulse Width1 8.4 ns tCP Clock Period1 20 21.5 ns Device Under Test 0.1 µf Input Output RL CL S1 Load Circuit (Notes 1, 2, 3) AC Testing Input, Output Waveform VDD 2.4 0.4 2.0 0.8 Test Points 2.0 0.8 CLKIN tCL tCP tCH |
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