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P89C51RC2BA/01 датащи(PDF) 61 Page - NXP Semiconductors |
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P89C51RC2BA/01 датащи(HTML) 61 Page - NXP Semiconductors |
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61 / 68 page ![]() Philips Semiconductors Preliminary data P89C51RA2/RB2/RC2/RD2xx 80C51 8-bit Flash microcontroller family 8KB/16KB/32KB/64KB ISP/IAP Flash with 512B/512B/512B/1KB RAM 2002 Jul 18 61 VCC–0.5 0.45V 0.2VCC+0.9 0.2VCC–0.1 NOTE: AC inputs during testing are driven at VCC –0.5 for a logic ‘1’ and 0.45V for a logic ‘0’. Timing measurements are made at VIH min for a logic ‘1’ and VIL max for a logic ‘0’. SU00717 Figure 47. AC Testing Input/Output VLOAD VLOAD+0.1V VLOAD–0.1V VOH–0.1V VOL+0.1V NOTE: TIMING REFERENCE POINTS For timing purposes, a port is no longer floating when a 100mV change from load voltage occurs, and begins to float when a 100mV change from the loaded VOH/VOL level occurs. IOH/IOL ≥ ±20mA. SU00718 Figure 48. Float Waveform 4 8 12 16 20 24 28 32 36 60 50 40 30 20 10 Frequency at XTAL1 (MHz, 12-clock mode) ICC (mA) MAXIMUM IDLE SU01631 TYPICAL ICC ACTIVE 89C51RA2/RB2/RC2/RD2 MAXIMUM ICC ACTIVE TYPICAL IDLE Figure 49. ICC vs. FREQ Valid only within frequency specifications of the device under test |
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