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PIC16LC712 датащи(PDF) 86 Page - Microchip Technology |
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PIC16LC712 датащи(HTML) 86 Page - Microchip Technology |
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86 / 106 page ![]() PIC16C712/716 DS41106C-page 86 1999-2013 Microchip Technology Inc. TABLE 12-7: A/D CONVERTER CHARACTERISTICS: PIC16C712/716-04 (COMMERCIAL, INDUSTRIAL, EXTENDED) PIC16C712/716-20 (COMMERCIAL, INDUSTRIAL, EXTENDED) PIC16LC712/716-04 (COMMERCIAL, INDUSTRIAL) Param No. Sym. Characteristic Min. Typ† Max. Units Conditions A01 NR Resolution — — 8-bits bit VREF = VDD = 5.12V, VSS £ VAIN £ VREF A02 EABS Total Absolute error —— < ± 1 LSb VREF = VDD = 5.12V, VSS £ VAIN £ VREF A03 EIL Integral linearity error — — < ± 1 LSb VREF = VDD = 5.12V, VSS £ VAIN £ VREF A04 EDL Differential linearity error — — < ± 1 LSb VREF = VDD = 5.12V, VSS £ VAIN £ VREF A05 EFS Full scale error — — < ± 1 LSb VREF = VDD = 5.12V, VSS £ VAIN £ VREF A06 EOFF Offset error — — < ± 1 LSb VREF = VDD = 5.12V, VSS £ VAIN £ VREF A10 — Monotonicity — guaranteed (Note 3) —— VSS £ VAIN £ VREF A20 VREF Reference voltage 2.5V — VDD + 0.3 V A25 VAIN Analog input voltage VSS - 0.3 — VREF + 0.3 V A30 ZAIN Recommended impedance of analog voltage source — — 10.0 k A40 IAD A/D conversion cur- rent (VDD) Standard — 180 — A Average current consump- tion when A/D is on. (Note 1) Extended (LC) — 90 — A A50 IREF VREF input current (Note 2) 10 — — — 1000 10 A A During VAIN acquisition. Based on differential of VHOLD to VAIN to charge CHOLD, see Section 9.1 “Configuration Bits”. During A/D Conversion cycle 2: * These parameters are characterized but not tested. 3: † Data in “Typ” column is at 5V, 25 C unless otherwise stated. These parameters are for design guidance only and are not tested. Note 1: When A/D is off, it will not consume any current other than minor leakage current. The power-down current spec includes any such leakage from the A/D module. 2: VREF current is from RA3 pin or VDD pin, whichever is selected as reference input. 3: The A/D conversion result never decreases with an increase in the Input Voltage, and has no missing codes. |
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