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ORSPI4 датащи(PDF) 133 Page - Lattice Semiconductor |
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ORSPI4 датащи(HTML) 133 Page - Lattice Semiconductor |
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133 / 263 page ![]() Lattice Semiconductor ORCA ORSPI4 Data Sheet 133 Table 37. High-Speed Serial Loopback Configuration Bit Definitions for the SERDES Parallel Loopback at the SERDES Boundary In this parallel loopback, differential data are received at the HDINP_x and HDINN_x pins and are retransmitted at the HDOUTP_x and HDOUTN_x pins. The loopback path is at the interface between the SERDES blocks and the MUX and DEMUX blocks and uses the parallel 10-bit buses at these interfaces (see Figure 70b). The loopback connection is made such that the input signals to the TX SERDES block is the same as the output signals from the RX SERDES block. In this parallel loopback mode, the MRWDx[39:0] signal lines remain active and the TWDx[31:0], TCOMMAx[3:0] and TBIT9x[3:0] signal lines are not used. This mode is normally used for tests where serial test data is received from and transmitted to either test equipment or via a serial backplane to a remote card and is the basic loopback path shown earlier in Figure 70(b). The data rate selection bits TXHR and RXHR in the channel configuration registers must be configured to carry the same value. Also, the 8b/10b encoder and decoder are excluded from the loopback path by setting the 8b10bT and 8b10bR configuration bits to “0”. Table 38 illus- trates the control interface register configuration for the parallel loopback. Table 38. Parallel Loopback at the SERDES Boundary Configuration Bit Definitions for the SERDES SERDES Characterization Test Mode The SERDES characterization mode is a test mode that allows for direct control and observation of the transmit and receive SERDES interfaces at chip ports. With these modes the SERDES logic and I/O can be tested one channel at a time in either the receive or transmit modes. The SERDES test mode requires that the SERDES block be selected instead of the SPIB block during the Module Generation phase of the ORSPI4 in ispLEVER. In addition, the TESTMD[1:0]N signals need to be set to “0” during SERDES characterization. Register Address Bit Value Bit Name Comments 30002, 30012, 30022, 30032 Bit 0 = 0 or 1 TXHR Set to “0” or “1”. TXHR and RXHR bits must be set to the same value. Bit 7 = 0 or 1 8B10BT Set to “0” or “1”. If set to “0”, the 8b/10b encoder is excluded from the loopback path. The 8b/10b encoder and decoder selection con- trol bits must both be set to the same value. 30801 Bit 0 = 1 (Channel A) Bit 1 = 1 (Channel B) Bit 2 = 1 (Channel C) Bit 3 = 1 (Channel D) LOOPENB_xx Set any of the bits 0-3 to “1” to do serial loopback on the corre- sponding channel.* The high-speed serial outputs will not be active. *This test mode can also be set using TESTEN_xx in place of LOOPENB_xx. In that case, Test Mode must be set to 00000. Register Address (Hex) Bit Value Bit Name Comments 30002, 30012, 30022, 30032 Bit 0 = 0 or 1 TXHR Set to “0” or “1”. TXHR and RXHR bits must be set to the same value. Bit 7 = 0 8b10bT Set to “0” The 8b/10b encoder is excluded from the loopback path. The 8b/10b encoder and decoder selection control bits must both be set to “0”. 30003, 30013, 30023, 30033 Bit 0 = 0 or 1 RXHR Set to “0” or “1”. TXHR and RXHR bits must be set to the same value. Bit 3 = 0 8b10bR Set to “0”. The 8b/10b decoder is excluded from the loopback path. The 8b/10b encoder and decoder selection control bits must both be set to “0”. 30005 Bit 7 = 1 GTESTEN SET to “1” if the loopback is done globally on all four channels. 30006, 30016, 30026, 30036 Bits[4:0] Testmode Set to 00001 |
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