STM32G070CB datasheet(61/93 Pages) STMICROELECTRONICS

61 / 93 page

DS12766 Rev 2

61/93

STM32G070CB/KB/RB

Electrical characteristics

Static latch-up

Two complementary static tests are required on six parts to assess the latch-up

performance:



A supply overvoltage is applied to each power supply pin.



A current is injected to each input, output and configurable I/O pin.

These tests are compliant with EIA/JESD 78A IC latch-up standard.

5.3.13

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDDIO1 (for standard, 3.3 V-capable I/O pins) should be avoided during normal

product operation. However, in order to give an indication of the robustness of the

microcontroller in cases when abnormal injection accidentally happens, susceptibility tests

are performed on a sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out-of-range parameter: ADC error above a certain limit

(higher than 5 LSB TUE), induced leakage current on adjacent pins out of conventional

limits (-5 µA/+0 µA range) or other functional failure (for example reset occurrence or

oscillator frequency deviation).

Negative induced leakage current is caused by negative injection and positive induced

leakage current is caused by positive injection.

Table 45. Electrical sensitivity

Symbol

Parameter

Conditions

Class

Static latch-up class

TA = +85 °C conforming to JESD78

II Level A

Table 46. I/O current injection susceptibility(1)

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on

All except PA4, PA5, PA6, PB0,

PB3, and PC0

-5

N/A

PA4, PA5

-5

PA6, PB0, PB3, and PC0

N/A

1. Based on characterization results, not tested in production.

STM32G070CB датащи(PDF) 61 Page - STMicroelectronics

STM32G070CB датащи(HTML) 61 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93

датащи скачать

ссылки URL