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STM32G070CB датащи(PDF) 44 Page - STMicroelectronics

номер детали STM32G070CB
подробное описание детали  Arm® Cortex®-M0 32-bit MCU, 128 KB Flash, 36 KB RAM, 4x USART, timers, ADC, comm. I/Fs, 2.0-3.6V
PDF  93 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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STM32G070CB датащи(HTML) 44 Page - STMicroelectronics

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Electrical characteristics
STM32G070CB/KB/RB
44/93
DS12766 Rev 2
5.3.4
Embedded voltage reference
The parameters given in Table 23 are derived from tests performed under the ambient
temperature and supply voltage conditions summarized in Table 20: General operating
conditions.
Table 22. Embedded reset and power control block characteristics
Symbol
Parameter
Conditions(1)
Min
Typ
Max
Unit
tRSTTEMPO(2)
POR temporization when VDD crosses VPOR
VDD rising
-
250
400
μs
VPOR(2)
Power-on reset threshold
-
2.06
2.10
2.14
V
VPDR(2)
Power-down reset threshold
-
1.96
2.00
2.04
V
Vhyst_POR_PDR
Hysteresis of VPOR and VPDR
Hysteresis in
continuous
mode
-20
-
mV
Hysteresis in
other mode
-30
-
1. Continuous mode means Run/Sleep modes, or temperature sensor enable in Low-power run/Low-power sleep modes.
2. Guaranteed by design.
Table 23. Embedded internal voltage reference
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VREFINT
Internal reference voltage
-40°C < TJ < 105°C
1.182 1.212
1.232
V
tS_vrefint (1)
ADC sampling time when reading
the internal reference voltage
-4(2)
--
µs
tstart_vrefint
Start time of reference voltage
buffer when ADC is enable
--
8
12(2)
µs
IDD(VREFINTBUF)
VREFINT buffer consumption from
VDD when converted by ADC
-
-
12.5
20(2)
µA
∆VREFINT
Internal reference voltage spread
over the temperature range
VDD = 3 V
-
5
7.5(2)
mV
TCoeff_vrefint
Temperature coefficient
-
-
30
50(2)
ppm/°C
ACoeff
Long term stability
1000 hours, T = 25 °C
-
300
1000(2)
ppm
VDDCoeff
Voltage coefficient
3.0 V < VDD < 3.6 V
-
250
1200(2)
ppm/V
VREFINT_DIV1
1/4 reference voltage
-
24
25
26
%
VREFINT
VREFINT_DIV2
1/2 reference voltage
49
50
51
VREFINT_DIV3
3/4 reference voltage
74
75
76
1. The shortest sampling time can be determined in the application by multiple iterations.
2. Guaranteed by design.



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