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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LPC81xM датащи(PDF) 62 Page - NXP Semiconductors |
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LPC81xM датащи(HTML) 62 Page - NXP Semiconductors |
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62 / 78 page  LPC81XM All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2018. All rights reserved. Product data sheet Rev. 4.6 — 4 April 2018 62 of 78 NXP Semiconductors LPC81xM 32-bit ARM Cortex-M0+ microcontroller 14.4 ElectroMagnetic Compatibility (EMC) Radiated emission measurements according to the IEC61967-2 standard using the TEM-cell method are shown for part LPC812M101FDH20. [1] IEC levels refer to Appendix D in the IEC61967-2 Specification. Table 28. ElectroMagnetic Compatibility (EMC) for part LPC812M101 (TEM-cell method) VDD = 3.3 V; Tamb = 25 C. Parameter Frequency band System clock = Unit 12 MHz 24 MHz 30 MHz Input clock: IRC (12 MHz) maximum peak level 1 MHz to 30 MHz 6 5 5dBV 30 MHz to 150 MHz -2 -1 -2 dB V 150 MHz to 1 GHz 1-1 -1 dB V IEC level[1] - OOO - Input clock: crystal oscillator (12 MHz) maximum peak level 1 MHz to 30 MHz 5 6 6dBV 30 MHz to 150 MHz 2-1 -2 dB V 150 MHz to 1 GHz 1-2 -1 dB V IEC level[1] - OON - |
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