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HT45F5R датащи(PDF) 12 Page - Holtek Semiconductor Inc |
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HT45F5R датащи(HTML) 12 Page - Holtek Semiconductor Inc |
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12 / 138 page ![]() Rev. 1.10 1� De�e��e� 1�� �01� Rev. 1.10 1� De�e��e� 1�� �01� HT45F5R Charger ASSP Flash MCU HT45F5R Charger ASSP Flash MCU Pin Name Function OP I/T O/T Description CP0N CP0N — AN — CMP0 negative input VDD/AVDD VDD — PWR — Digital positive powe� supply AVDD — PWR — Analog positive powe� supply VSS/AVSS VSS — PWR — Digital negative powe� supply AVSS — PWR — Analog negative powe� supply Lenged:I/T:Inputtype; O/T:Outputtype; OP:Optionalbyregisteroption; PWR:Power; ST:SchmittTriggerinput; CMOS:CMOSoutput; AN:Analogsignal; *:VDDisthedevicepowersupplywhileAVDDistheADCpowersupply.TheAVDDpinisbonded togetherinternallywithVDD. **:VSSisthedevicegroundpinwhileAVSSistheADCgroundpin.TheAVSSpinisbondedtogether internallywithVSS. Absolute Maximum Ratings SupplyVoltage................................................................................................VSS−0.3VtoVSS+6.0V InputVoltage..................................................................................................VSS−0.3VtoVDD+0.3V StorageTemperature....................................................................................................-50˚Cto125˚C OperatingTemperature..................................................................................................-40˚Cto85˚C IOLTotal..................................................................................................................................... 80mA IOHTotal....................................................................................................................................-80mA TotalPowerDissipation......................................................................................................... 500mW Note:Thesearestressratingsonly.Stressesexceedingtherangespecifiedunder"Absolute MaximumRatings"maycausesubstantialdamagetothedevice.Functionaloperationofthis deviceatotherconditionsbeyondthoselistedinthespecificationisnotimpliedandprolonged exposuretoextremeconditionsmayaffectdevicereliability. |
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