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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AT83C5111 датащи(PDF) 74 Page - ATMEL Corporation |
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AT83C5111 датащи(HTML) 74 Page - ATMEL Corporation |
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74 / 86 page  74 AT8xC5111 4190A–8051–11/02 6. If I OL exceeds the test condition, VOL may exceed the relat ed specificat ion. Pins are not guaranteed to sink current great er than the listed test conditions. 7. For other values, please contact your sales office. 8. Operat ing I CC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure 34.), VIL = V SS + 0.5V, VIH = VCC - 0.5V; XTAL2 N.C.; RST/VPP = VCC;. The internal ROM runs the code 80 FE (label: SJMP label). ICC would be slightly higher if a crystal oscillat or is used. Measurements are made with OTP products when possible, which is the worst case. Figure 1. I CC Test Condition, Under Reset Figure 2. Operat ing I CC Test Condition V CC ICC (NC) CL OC K SIGNAL All other pins are disconnected. RST XTAL2 XTAL1 V SS V CC V CC I CC (NC) CLO C K SIGNAL All other pins are disconnected. RST XTAL2 XTAL1 V SS V CC Reset = V SS after a high pulse during at least 24 clock cycles V CC |
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