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PC97338 датащи(PDF) 143 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
номер детали PC97338
подробное описание детали  ACPI 1.0 and PC98/99 Compliant SuperI/O
PDF  221 Pages
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производитель  NSC [National Semiconductor (TI)]
домашняя страница  http://www.national.com
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PC97338 датащи(HTML) 143 Page - National Semiconductor (TI)

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When ACK is asserted the ECP drives AFD high.
When AFD is high the peripheral device deasserts
ACK. The ECP reads the PD7-0 byte, then drives
AFD low. When AFD is low the peripheral device may
change BUSY and PD7-0 states in preparation for the
next cycle
.
FIGURE 88. ECP (Reverse) Read Cycle
Notes:
1. FIFO-full condition is checked before every ex-
panded byte push.
2. Switching from modes 010 or 011 to other modes
removes pending DMA requests and aborts pend-
ing RLE expansion.
3. FIFO pushes and pops are neither synchronized
nor linked at the hardware level. The FIFO will not
delay these operations, even if performed concur-
rently. Care must be taken by the programmer to
utilize the empty and full FIFO status bits to avoid
corrupting PD7-0 or D7-0 while a previous FIFO
port access not complete.
4. In the forward direction, the empty bit is updated
when the ECP cycle is completed, not when the
last byte is popped from the FIFO (valid cleared on
cycle end).
5. ZWS is not asserted for DMA cycles.
6. The one-bit command/data tag is used only in the
forward direction.
7. The DRQ (DMA Request) signal is always deas-
serted for a minimum of 330
µs after, at most, 32
consecutive DMA acess cycles.
8. If the FDC, UART, and UIR are not enabled (FER
Configuration Register) after power-up, the ECP
clock is blocked. To enable the ECP clock, set
PCR bit 3 (ECP Clock Freeze Control) to enable
ECP mode, or set the FER register bit 3 (FDC En-
able) and then reset it.
4.5.3
FIFO Test Access (Mode 110)
Mode 110 is for testing the FIFO in PIO and DMA cy-
cles. Both read and write operations (pop and push)
are supported, regardless of the direction bit.
In the forward direction PD7-0 are driven, but the data
is undefined. This mode can be used to measure the
system-ECP cycle throughput, usually with DMA cy-
cles. This mode can also be used to check the FIFO
depth and its interrupt threshold, usually with PIO cy-
cles.
4.5.4
Configuration Registers Access
(Mode 111)
The two configuration registers, CNFGA and CNFGB,
are accessible only in this mode.
4.5.5
Interrupt Generation
An interrupt is generated according to bit 5 and 6 set-
ting in the PCR, when any of the events described in
this section occurs. Interrupt events 2, 3 and 4 are lev-
el events. They are shaped as interrupt pulses, and
are masked (inactive) when the ECP clock is frozen.
Event 1
Bit 2 of ECR is 0, bit 3 of ECR is 1 and TC is as-
serted during ECP DMA cycle. Interrupt event 1 is
a pulse event.
Event 2
Bit 2 of ECR is 0, bit 3 of ECR is 0, bit 5 of DCR is
0 and there are eight or more bytes free in the
FIFO.
This event includes the case when bit 2 of ECR is
cleared to 0 and there are already eight or more
bytes free in the FIFO (modes 010, 011 and 110
only).
Event 3
Bit 2 of ECR is 0, bit 3 of ECR is 0, bit 5 of DCR is
1 and there are eight or more bytes to be read from
the FIFO.
This event includes the case when bit 2 of ECR is
cleared to 0 and there are already eight or more
bytes to be read from the FIFO (modes 011 and
110 only).
Event 4
Bit 4 of ECR is 0 and ERR is asserted (high to low
edge) or ERR is asserted when bit 4 of ECR is
modified from 1 to 0.
This event may be lost when the ECP clock is fro-
zen.
Event 5
When bit 4 of DCR is 1 and ACK is deasserted
(low-to-high edge).
This event behaves as in the normal SPP mode,
i.e., the IRQ signal follows the ACK signal transi-
tion (when bit 5 of PCR is 0 and bit 6 of PCR is 0).
PD7-0
BUSY
AFD
ACK



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