STM32L081CB datasheet(76/110 Pages) STMICROELECTRONICS

номер детали	STM32L081CB

подробное описание детали	Access line ultra-low-power 32-bit MCU ARM-based Cortex-M0, up to 192KB Flash, 20KB SRAM, 6KB EEPROM, ADC, AES

PDF	110 Pages

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производитель	STMICROELECTRONICS [STMicroelectronics]

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76 / 110 page

Electrical characteristics

STM32L081xx

76/110

DocID027513 Rev 4

6.3.12

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard pins) should be avoided during normal product operation.

However, in order to give an indication of the robustness of the microcontroller in cases

when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (higher

than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out

of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator

frequency deviation).

The test results are given in the Table 52.

Table 52. I/O current injection susceptibility

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on BOOT0

-0

Injected current on PA0, PA4, PA5, PC15,

PH0 and PH1

-5

Injected current on any other FT, FTf pins

-5 (1)

1. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject

negative currents.

Injected current on any other pins

-5 (1)

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