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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM32L081CB датащи(PDF) 74 Page - STMicroelectronics |
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STM32L081CB датащи(HTML) 74 Page - STMicroelectronics |
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74 / 110 page  Electrical characteristics STM32L081xx 74/110 DocID027513 Rev 4 To complete these trials, ESD stress can be applied directly on the device, over the range of specification values. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note AN1015). Electromagnetic Interference (EMI) The electromagnetic field emitted by the device are monitored while a simple application is executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with IEC 61967-2 standard which specifies the test board and the pin loading. Table 49. EMI characteristics Symbol Parameter Conditions Monitored frequency band Max vs. frequency range at 32 MHz Unit SEMI Peak level VDD 3.6 V, TA 25 °C, compliant with IEC 61967-2 0.1 to 30 MHz -7 dBµV 30 to 130 MHz 14 130 MHz to 1 GHz 9 EMI Level 2 - |
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