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PC87382 датащи(PDF) 62 Page - National Semiconductor (TI) |
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PC87382 датащи(HTML) 62 Page - National Semiconductor (TI) |
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62 / 72 page ![]() 8.0 Device Characteristics (Continued) www.national.com 62 Revision1.2 8.3 INTERNAL RESISTORS DC Test Conditions Figure 14. Internal Resistor Test Conditions, TA =0°Cto70°C, VSUP = 3.3V Figure 15. Internal Pull-Down Resistor for Straps, TA =0°Cto70°C, VSUP = 3.3V Notes for Figures 14 and 15: 1. The equivalent resistance of the pull-up resistor is calculated by RPU = (VSUP − VPIN) / IPU. 2. The equivalent resistance of the pull-down resistor is calculated by RPD = VPIN / IPD. 8.3.1 Pull-Up Resistor Symbol: PUnn Symbol Parameter Conditions1 1. TA = 0 °C to 70°C, V SUP = 3.3V. Min2 2. Not tested. Guaranteed by characterization. Typical Max2 Unit RPU Pull-up equivalent resistance VPIN =0V nn − 30% nn nn + 30% K Ω VPIN = 0.8 VSUP 3 nn − 38% K Ω VPIN = 0.17 VSUP 3 3. For strap pins only. nn − 35% K Ω Device Under Test RPU Pull-Up Resistor Test Circuit Pull-Down Resistor Test Circuit VSUP Pin A IPU V VPIN Device Under Test RPD VSUP Pin A IPD V VPIN VSUP Device Under Test RPU VSUP Pin A IPU V VPIN VSUP Device Under Test RPU VSUP Pin A IPU V VPIN 10 µA VPIN < VIL VPIN > VIH 10 µA 10 K Ω |
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