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28F020 датащи(PDF) 18 Page - Intel Corporation |
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28F020 датащи(HTML) 18 Page - Intel Corporation |
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18 / 38 page ![]() 28F020 E 18 4.0 ELECTRICAL SPECIFICATIONS 4.1 Absolute Maximum Ratings* Operating Temperature During Read .........................0 °C to +70 °C(1) During Erase/Program ..........0 °C to +70 °C(1) Operating Temperature During Read .....................–40 °C to +85 °C(2) During Erase/Program ......–40 °C to +85 °C(2) Temperature Under Bias.........–10 °C to +80 °C(1) Temperature Under Bias.........–50 °C to +95 °C(2) Storage Temperature............... –65 °C to +125 °C Voltage on Any Pin with Respect to Ground ............ –2.0 V to +7.0 V(2) Voltage on Pin A9 with Respect to Ground ........–2.0 V to +13.5 V(2,3) VPP Supply Voltage with Respect to Ground During Erase/Program ...–2.0 V to +14.0 V(2,3) VCC Supply Voltage with Respect to Ground ............ –2.0 V to +7.0 V(2) Output Short Circuit Current.................. 100 mA(4) NOTICE: This is a production datasheet. The specifications are subject to change without notice. *WARNING: Stressing the device beyond the Absolute Maximum Ratings may cause permanent damage. These are stress ratings only. Operation beyond the Operating Conditions is not recommended and extended exposure beyond the Operating Conditions may affect device reliability. NOTES: 1. Operating temperature is for commercial product defined by this specification. 2. Operating temperature is for extended temperature product as defined by this specification. 3. Minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods less than 20 ns. Maximum DC voltage on output pins is VCC + 0.5 V, which may overshoot to VCC + 2.0 V for periods less than 20 ns. 4. Maximum DC voltage on A 9 or VPP may overshoot to +14.0 V for periods less than 20 ns. 5. Output shorted for no more than one second. No more than one output shorted at a time. 6. See Testing Input/Output Waveform (Figure 6) and AC Testing Load Circuit (Figure 7) for testing characteristics. 7. See High Speed AC Testing Input/Output Waveform (Figure 8) and High Speed AC Testing Load Circuit (Figure 9) for testing characteristics. 4.2 Operating Conditions Limits Symbol Parameter Min Max Unit TA Operating Temperature(1) 070 °C TA Operating Temperature(2) –40 +85 °C VCC VCC Supply Voltage (10%)(6) 4.50 5.50 V VCC VCC Supply Voltage (5%)(7) 4.75 5.25 V 4.3 Capacitance TA = 25 °C, f = 1.0 MHz Limits Symbol Parameter Notes Min Max Unit Conditions CIN Address/Control Capacitance 1 8 pF VIN = 0 V COUT Output Capacitance 1 12 pF VOUT = 0 V NOTE: 1. Sampled, not 100% tested. |
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