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28F016SA датащи(PDF) 24 Page - Intel Corporation |
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28F016SA датащи(HTML) 24 Page - Intel Corporation |
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24 / 55 page ![]() 28F016SA E 24 TEST POINTS INPUT OUTPUT 2.0 0.8 0.8 2.0 2.4 0.45 0489_06 AC test inputs are driven at V OH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH (2.0 VTTL) and V IL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns. Figure 7. Transient Input/Output Reference Waveform (VCC = 5.0V ± 10%) for Standard Test Configuration(1) TEST POINTS INPUT OUTPUT 1.5 3.0 0.0 1.5 0489_07 AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V. Input rise and fall times (10% to 90%) <10 ns. Figure 8. Transient Input/Output Reference Waveform (VCC = 3.3V ± 10%) High Speed Reference Waveform(2) (VCC = 5.0V ± 5%) NOTES: 1. Testing characteristics for 28F016SA-080/28F016SA-100. 2. Testing characteristics for 28F016SA-070/28F016SA-120/28F016SA-150. |
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