STM8L151F3P6 datasheet(53/112 Pages) STMICROELECTRONICS

номер детали	STM8L151F3P6

подробное описание детали	8-bit ultralow power MCU, up to 8 KB Flash, up to 256 B data EEPROM, RTC, timers, USART, I2C, SPI, ADC, comparators

PDF	112 Pages

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производитель	STMICROELECTRONICS [STMicroelectronics]

домашняя страница	http://www.st.com

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STM8L151x2, STM8L151x3

Electrical parameters

Doc ID 018780 Rev 4

53/112

7.3.2

Embedded reset and power control block characteristics

Table 15.

Embedded reset and power control block characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

tVDD

VDD rise time rate

BOR detector

enabled

0(1)

∞ (1)

µs/V

VDD fall time rate

BOR detector

enabled

20(1)

∞ (1)

tTEMP

Reset release delay

VDD rising

3(1)

VPDR

Power-down reset threshold

Falling edge

1.30(2)

1.50

1.65

VBOR0

Brown-out reset threshold 0

(BOR_TH[2:0]=000)

Falling edge

1.66

1.70

1.74

Rising edge

1.39

1.75

1.81

VBOR1

Brown-out reset threshold 1

(BOR_TH[2:0]=001)

Falling edge

1.89

1.93

1.97

Rising edge

1.98

2.03

2.07

VBOR2

Brown-out reset threshold 2

(BOR_TH[2:0]=010)

Falling edge

2.25

2.30

2.35

Rising edge

2.35

2.40

2.44

VBOR3

Brown-out reset threshold 3

(BOR_TH[2:0]=011)

Falling edge

2.50

2.55

2.60

Rising edge

2.59

2.65

2.70

VBOR4

Brown-out reset threshold 4

(BOR_TH[2:0]=100)

Falling edge

2.74

2.79

2.85

Rising edge

2.83

2.89

2.95

VPVD0

PVD threshold 0

Falling edge

2.82

1.85

1.88

Rising edge

1.89

1.94

1.97

VPVD1

PVD threshold 1

Falling edge

2.04

2.05

2.08

Rising edge

2.12

2.14

2.17

VPVD2

PVD threshold 2

Falling edge

2.21

2.24

2.28

Rising edge

2.31

2.33

2.37

VPVD3

PVD threshold 3

Falling edge

2.41

2.44

2.48

Rising edge

2.51

2.53

2.57

VPVD4

PVD threshold 4

Falling edge

2.61

2.64

2.69

Rising edge

2.71

2.74

2.79

VPVD5

PVD threshold 5

Falling edge

2.79

2.83

2.88

Rising edge

2.90

2.94

2.99

VPVD6

PVD threshold 6

Falling edge

3.01

3.04

3.09

Rising edge

3.12

3.15

3.20

Data guaranteed by design, not tested in production.

Data based on characterization results, not tested in production.

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