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RA4E1 датащи(PDF) 57 Page - Renesas Technology Corp

номер детали RA4E1
подробное описание детали  Renesas Microcontrollers
PDF  81 Pages
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производитель  RENESAS [Renesas Technology Corp]
домашняя страница  http://www.renesas.com
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RA4E1 датащи(HTML) 57 Page - Renesas Technology Corp

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Table 2.34
A/D conversion characteristics for unit 0 (2 of 2)
Conditions: PCLKC = 1 to 50 MHz
Parameter
Min
Typ Max Unit Test conditions
High-precision high-speed
channels
(AN000 to AN002)
Conversion time*1
(operation at PCLKC =
50 MHz)
Permissible signal
source impedance Max.
= 1 kΩ
0.52 (0.26)*2 —
μs
Sampling in 13
states
Max. = 400 Ω
0.40 (0.14)*2 —
μs
Sampling in 7
states
VCC = AVCC0 =
3.0 to 3.6 V
3.0 V ≤ VREFH0 ≤
AVCC0
Offset error
±1.0 ±2.5 LSB —
Full-scale error
±1.0 ±2.5 LSB —
Absolute accuracy
±2.0 ±4.5 LSB —
DNL differential nonlinearity error
±0.5 ±1.5 LSB —
INL integral nonlinearity error
±1.0 ±2.5 LSB —
High-precision normal-speed
channels
(AN003, AN004, AN011 to
AN013)
Conversion time*1
(Operation at PCLKC =
50 MHz)
Permissible signal
source impedance Max.
= 1 kΩ
0.92 (0.66)*2 —
μs
Sampling in 33
states
Offset error
±1.0 ±2.5 LSB —
Full-scale error
±1.0 ±2.5 LSB —
Absolute accuracy
±2.0 ±4.5 LSB —
DNL differential nonlinearity error
±0.5 ±1.5 LSB —
INL integral nonlinearity error
±1.0 ±2.5 LSB —
Normal-precision normal-speed
channels (AN016)
Conversion time*1
(Operation at PCLKC =
50 MHz)
Permissible signal
source impedance Max.
= 1 kΩ
0.92 (0.66)*2 —
μs
Sampling in 33
states
Offset error
±1.0 ±5.5 LSB —
Full-scale error
±1.0 ±5.5 LSB —
Absolute accuracy
±2.0 ±7.5 LSB —
DNL differential nonlinearity error
±0.5 ±4.5 LSB —
INL integral nonlinearity error
±1.0 ±5.5 LSB —
Note:
These specification values apply when there is no access to the external memory during A/D conversion. If access occurs during
A/D conversion, values might not fall within the indicated ranges.
The use of PORT0 as digital outputs is not allowed when the 12-Bit A/D converter is used.
The characteristics apply when AVCC0, AVSS0, VREFH0, VREFL0, and 12-bit A/D converter input voltage are stable.
Note 1. The conversion time includes the sampling and comparison times. The number of sampling states is indicated for the test
conditions.
Note 2. Values in parentheses indicate the sampling time.
Table 2.35
A/D internal reference voltage characteristics
Parameter
Min
Typ
Max
Unit
Test conditions
A/D internal reference voltage
1.13
1.18
1.23
V
Sampling time
4.15
µs
RA4E1 Datasheet
2. Electrical Characteristics
R01DS0391EJ0130 Rev.1.30
Jun 6, 2025
Page 57 of 81



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