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TC35679FSG датащи(PDF) 8 Page - Toshiba Semiconductor |
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TC35679FSG датащи(HTML) 8 Page - Toshiba Semiconductor |
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8 / 45 page ![]() TC35679FSG-002 2018-01-17 8 Pin name Pin No. Attribute Condition Functional description VDD category Direction Type Default (during reset) GPIO13 25 VDDIO IN/OUT Pull-up Pull-down Schmitt trigger Pull-up General purpose IO pin. During reset, the pull-up resistor is connected (input disable state). The pull-up and pull-down resistors are unconnected (input disable state) just after the reset is released, and it will be controlled by software after that. After the pin configuration by software processing, it works as a GPIO pin of the input and output or Table 2-2 function. (Note) GPIO15 33 VDDIO IN/OUT Pull-up Pull-down Schmitt trigger Hi-Z General purpose I/O pin. During reset, the pull-up and pull-down resistors are unconnected (input disable state). The pull-up resistor is connected (input state) just after the reset is released, and it will be controlled by software after that. After the pin configuration by software processing, it works as a GPIO pin of the input and output or Table 2-2 function. Pin processing when not using this function are listed in Table 2-2. (Note)) Emulator debug control interface SWDCLK 32 VDDIO IN Pull-up Pull-down Schmitt trigger Pull-down Serial Wire debugger clock pin. During reset, the pull-down resistor is connected (input state). After the reset is released, the serial wire debugger clock is inputted. When not used, this pin should be open. SWDIO 17 VDDIO IN/OUT Pull-up Pull-down Schmitt trigger Pull-up Serial Wire Debugger data pin and operation switching pin. During reset, the pull-up resistor is connected (input state). After the reset is released, the serial wire debugger data is inputted and outputted. When not used, this pin should be open. IC test interface TMODE 4 VDDIO IN Schmitt trigger — Test mode setting pin. This pin is used for IC manufacturing test and needs to be connected to GND when assembled on a board. TRTEST1 TRTEST2 9 10 VDD12A IN/OUT Analog — Analog test pins. These pins are used for IC manufacturing test and need to be connected to GND when assembled on a board. Note: The state of the GPIO pin corresponds to the usage state in the user application mode. Since states differ partially when the operation is powered on with the HCI mode, please refer to the software application note about the detailed state and its setting method of each pin. |
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