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STM32G0 датащи(PDF) 78 Page - STMicroelectronics

номер детали STM32G0
подробное описание детали  Arm® Cortex®-M0 32-bit MCU, up to 128 KB Flash, 36 KB RAM, 4x USART, timers, ADC, DAC, comm. I/Fs, 1.7-3.6V
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Electrical characteristics
STM32G071x8/xB
78/135
DS12232 Rev 4
5.3.12
Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
•
A supply overvoltage is applied to each power supply pin.
•
A current is injected to each input, output and configurable I/O pin.
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 47. EMI characteristics
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fHSE/fHCLK]
Unit
8 MHz / 64 MHz
SEMI
Peak level
VDD = 3.6 V, TA = 25 °C,
LQFP64 package
compliant with IEC 61967-2
0.1 MHz to 30 MHz
7
dBµV
30 MHz to 130 MHz
-1
130 MHz to 1 GHz
8
1 GHz to 2 GHz
7
EMI level
2.5
-
Table 48. ESD absolute maximum ratings
Symbol
Ratings
Conditions
Class
Maximum
value(1)
Unit
VESD(HBM)
Electrostatic discharge voltage
(human body model)
TA = +25 °C, conforming to
ANSI/ESDA/JEDEC JS-001
2
2000
V
VESD(CDM)
Electrostatic discharge voltage
(charge device model)
TA = +25 °C, conforming to
ANSI/ESDA/JEDEC JS-002
C2a
500
1. Based on characterization results, not tested in production.
Table 49. Electrical sensitivity
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +125 °C conforming to JESD78
II Level A



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