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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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DSM2180F3 датащи(PDF) 45 Page - STMicroelectronics |
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DSM2180F3 датащи(HTML) 45 Page - STMicroelectronics |
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45 / 63 page  45/63 DSM2180F3 MAXIMUM RATING Stressing the device above the rating listed in the Absolute Maximum Ratings table may cause per- manent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not im- plied. Exposure to Absolute Maximum Rating con- ditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality docu- ments. Table 21. Absolute Maximum Ratings Note: 1. IPC/JEDEC J-STD-020A 2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 Ω, R2=500 Ω) Symbol Parameter Min. Max. Unit TSTG Storage Temperature –65 125 °C TLEAD Lead Temperature during Soldering (20 seconds max.)1 235 °C VIO Input and Output Voltage (Q = VOH or Hi-Z) –0.6 7.0 V VCC Supply Voltage –0.6 7.0 V VPP Device Programmer Supply Voltage –0.6 14.0 V VESD Electrostatic Discharge Voltage (Human Body model) 2 –2000 2000 V |
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