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DLP4710AFQL датащи(PDF) 10 Page - Texas Instruments

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номер детали DLP4710AFQL
подробное описание детали  0.47 1080p DMD
PDF  43 Pages
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
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DLP4710AFQL датащи(HTML) 10 Page - Texas Instruments

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10
DLP4710
DLPS125 – NOVEMBER 2018
www.ti.com
Product Folder Links: DLP4710
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
Recommended Operating Conditions (continued)
Over operating free-air temperature range (unless otherwise noted)
(1) (2) (3)
MIN
NOM
MAX
UNIT
(11) Simultaneous exposure of the DMD to the maximum Recommended Operating Conditions for temperature and UV illumination will
reduce device lifetime.
(12) The array temperature cannot be measured directly and must be computed analytically from the temperature measured at test point 1
(TP1) shown in Figure 18 and the Package Thermal Resistance using Micromirror Array Temperature Calculation.
(13) Per Figure 1, the maximum operational array temperature should be derated based on the micromirror landed duty cycle that the DMD
experiences in the end application. Refer to Micromirror Landed-On/Landed-Off Duty Cycle for a definition of micromirror landed duty
cycle.
(14) Long-term is defined as the usable life of the device
(15) Short-term is the total cumulative time over the useful life of the device.
(16) Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge shown in
Figure 18. The window test points TP2, TP3, TP4, and TP5 shown in Figure 18 are intended to result in the worst case delta
temperature. If a particular application causes another point on the window edge to result in a larger delta temperature, that point should
be used.
(17) Window temperature is the highest temperature on the window edge shown in Figure 18. The locations of thermal test points TP2, TP3,
TP4, and TP5 in Figure 18 are intended to measure the highest window edge temperature. If a particular application causes another
point on the window edge to be at a higher temperature, that point should be used.
(18) The average over time (including storage and operating) that the device is not in the elevated dew point temperature range.
(19) Exposure to dew point temperatures in the elevated range during storage and operation should be limited to less than a total cumulative
time of CTELR.
(20) The maximum marginal ray angle of the incoming illumination light at any point in the micromirror array, including Pond of Micromirrors
(POM), should not exceed 55 degrees from the normal to the device array plane. The device window aperture has not necessarily been
designed to allow incoming light at higher maximum angles to pass to the micromirrors, and the device performance has not been tested
nor qualified at angles exceeding this. Illumination light exceeding this angle outside the micromirror array (including POM) will
contribute to thermal limitations described in this document, and may negatively affect lifetime.
ENVIRONMENTAL
TARRAY
Array Temperature – long-term operational(11)(12)(13)(14)
0
40 to
70(13)
°C
Array Temperature - short-term operational, 25 hr max(12)(15)
–20
-10
Array Temperature - short-term operational, 500 hr max(12)(15)
–10
0
Array Temperature – short-term operational, 500 hr max(12)(15)
70
75
|TDELTA|
Absolute Temperature difference between any point on the window
edge and the ceramic test point TP1(16)
30
°C
TWINDOW
Window Temperature – operational(11) (17)
90
°C
TDP-AVG
Average dew point temperature (non-condensing)(18)
24
°C
TDP-ELR
Elevated dew point temperature range (non-condensing)(19)
28
36
°C
CTELR
Cumulative time in elevated dew point temperature range
6
Months
ILLUV
Illumination wavelengths < 420 nm (11)
0.68
mW/cm2
ILLVIS
Illumination wavelengths between 420 nm and 700 nm
Thermally limited
ILLIR
Illumination wavelengths > 700 nm
10
mW/cm2
ILLθ
Illumination marginal ray angle(20)
55
degrees



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