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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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DLP4710AFQL датащи(PDF) 18 Page - Texas Instruments |
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DLP4710AFQL датащи(HTML) 18 Page - Texas Instruments |
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18 / 43 page  CL Tester Channel Output Under Test Data Sheet Timing Reference Point Device Pin Stop Start LS_CLK LS_WDATA LS_RDATA Acknowledge tPD VIH Δ VT VT+ VT- VIL LS_WDATA LS_CLK Not to Scale 18 DLP4710 DLPS125 – NOVEMBER 2018 www.ti.com Product Folder Links: DLP4710 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated (1) Device electrical characteristics are over Recommended Operating Conditions unless otherwise noted. Figure 11. LPSDR Input Hysteresis Figure 12. LPSDR Read Out See Timing for more information. Figure 13. Test Load Circuit for Output Propagation Measurement 6.8 Switching Characteristics (1) Over operating free-air temperature range (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tPD Output propagation, Clock to Q, rising edge of LS_CLK input to LS_RDATA output. Figure 12 CL = 45 pF 15 ns Slew rate, LS_RDATA 0.5 V/ns Output duty cycle distortion, LS_RDATA 40% 60% |
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