| поискавой системы для электроныых деталей |
|
ENICSF2811PBKA датащи(PDF) 101 Page - Texas Instruments |
|
|
|||||||||||||||||||||||||||||
ENICSF2811PBKA датащи(HTML) 101 Page - Texas Instruments |
|
101 / 172 page ![]() Transmission Line 4.0 pF 1.85 pF Z0 = 50 W (A) Tester Pin Electronics Data Sheet Timing Reference Point Output Under Test 42 W 3.5 nH Device Pin (A) TMS320F2810, TMS320F2811, TMS320F2812 TMS320C2810, TMS320C2811, TMS320C2812 www.ti.com SPRS174T – APRIL 2001 – REVISED MAY 2012 6.10 Timing Parameter Symbology Timing parameter symbols used are created in accordance with JEDEC Standard 100. To shorten the symbols, some of the pin names and other related terminology have been abbreviated as follows: Lowercase subscripts and their meanings: Letters and symbols and their meanings: a access time H High c cycle time (period) L Low d delay time V Valid f fall time X Unknown, changing, or don't care level h hold time Z High impedance r rise time su setup time t transition time v valid time w pulse duration (width) 6.11 General Notes on Timing Parameters All output signals from the 28x devices (including XCLKOUT) are derived from an internal clock such that all output transitions for a given half-cycle occur with a minimum of skewing relative to each other. The signal combinations shown in the following timing diagrams may not necessarily represent actual cycles. For actual cycle examples, see the appropriate cycle description section of this document. 6.12 Test Load Circuit This test load circuit is used to measure all switching characteristics provided in this document. A. The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects must be taken into account. A transmission line with a delay of 2 ns or longer can be used to produce the desired transmission line effect. The transmission line is intended as a load only. It is not necessary to add or subtract the transmission line delay (2 ns or longer) from the data sheet timing. Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the device pin. Figure 6-9. 3.3-V Test Load Circuit Copyright © 2001–2012, Texas Instruments Incorporated Electrical Specifications 101 Submit Documentation Feedback Product Folder Link(s): TMS320F2810 TMS320F2811 TMS320F2812 TMS320C2810 TMS320C2811 TMS320C2812 |
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |