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KAF-8300 датащи(PDF) 18 Page - ON Semiconductor

номер детали KAF-8300
подробное описание детали  Full Frame CCD Image Sensor
PDF  28 Pages
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производитель  ONSEMI [ON Semiconductor]
домашняя страница  http://www.onsemi.com
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KAF-8300 датащи(HTML) 18 Page - ON Semiconductor

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18
TIMING
Table 14. REQUIREMENTS AND CHARACTERISTICS
Description
Symbol
Minimum
Nominal
Maximum
Unit
Notes
H1, H2 Clock Frequency
fH
28
MHz
1, 2
V1, V2 Clock Frequency
fV
125
kHz
2
Pixel Period (1 Count)
te
35.7
ns
2
H1, H2 Set-up Time
tHS
1
ms
H1L−VOUT Delay
tHV
0
3
ns
RG−VOUT Delay
tRV
0
1
ns
Readout Time
tREADOUT
340.2
ms
4, 5
Integration Time
tINT
3, 4
Line Time
tLINE
132.2
ms
4
Flush Time
tFLUSH
21.23
ms
6
1. 50% duty cycle values.
2. CTE will degrade above the nominal frequency.
3. Integration time is user specified.
4. Longer times will degrade noise performance.
5. tREADOUT = tLINE ⋅ 2574 lines.
6. See Figure 19 for a detailed description.
Table 15. CLOCK SWITCHING CHARACTERISTICS
Description
Symbol
Min.
Nom.
Max.
Unit
Notes
V1 Rise Time
tV1r
0.26
1
ms
3
V2 Rise Time
tV2r
0.55
1
ms
3
V1 Fall Time
tV1f
0.43
1
ms
3
V2 Fall Time
tV2f
0.31
1
ms
3
V1 Pulse Width
tV1w
5.0
ms
4, 5
V2 Pulse Width
tV2w
3.0
ms
4, 5
H1 Rise Time
tH1r
9.0
10
ns
3
H2 Rise Time
tH2r
6.9
10
ns
3
H1 Fall Time
tH1f
5.8
10
ns
3
H2 Fall Time
tH2r
5.4
10
ns
3
H1−H2 Pulse Width
tH1w, tH2w
14
18
22
ns
H1L Rise Time
tH1Lr
1.8
4
ns
3
H1L Fall Time
tH1Lf
2.5
4
ns
3
H1L Pulse Width
tH1Lw
14
19
22
ns
RG Rise Time
tRGr
2.0
4
ns
3
RG Fall Time
tRGf
2.2
4
ns
3
RG Pulse Width
tRGw
6.7
ns
2
1. H1, H2 clock frequency: 28 MHz. The maximum and minimum values in this table are supplied for reference. The actual clock timing was
measured using the KAF−8300 Evaluation Board. Testing against the device performance specifications is performed using the nominal
values.
2. RG should be clocked continuously.
3. Relative to the pulse width (based on 50% of high/low levels).
4. CTE
5. Longer times will degrade noise performance.



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