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AN3077 датащи(PDF) 41 Page - STMicroelectronics |
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AN3077 датащи(HTML) 41 Page - STMicroelectronics |
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41 / 82 page ![]() DocID16384 Rev 10 41/82 AN3077 Functional safety requirements for application software 81 Figure 10. Implementation of ADC_SW_TEST1 through the ADC presample feature ● ADC_SWTEST_TEST2 To detect short failures two different voltages are acquired by the ADC. If these values are different from the expected ones, a short failure on the multiplexed circuitry has been detected. To implement this test a presampling feature of the ADC can be exploited. The presampling must be configured in such a way that the sampling of the channel is bypassed and the presampling reference supply voltages are converted. During the first step the VDD_HV_ADR0/1 is converted and compared with the its expected value, then the VSS_HV_ADR0/1 is converted and compared with its expected value (See Figure 12). Figure 12 includes the conversion of the 2 different presampling reference voltages (VDD_HV_ADR0/1 and VSS_VH_ADR0/1). Note: Rationale: To detect short failures of the channel multiplexing circuitry (See Figure 11) Figure 11. Software BISTs to test the multiplexing circuitry (ADC_SWTEST_TEST2) Note: Implementation hint: The implementation hints of the ADC_SWTEST_TEST1 applies also to the ADC_SWTEST_TEST2 To bypass the conversion of the input channel and convert the presampled values, ADC_x_PSCR[PRECONV] register shall be set to 1. Figure 12. Implementation of ADC_SW_TEST2 through the ADC presample feature Convert Ch A Presample Ch B Sample Ch B Convert Ch B Presample Ch A Sample Ch A t Vdd_HV_ADRx or Vss_HV_ADRx Note: Either VDD_HV_ADR0/1 or VSS_HV_ADR0/1 can be used as presampling voltage. ADC Reference value 2 pins ADC Reference value 1 pins ADC ADC ADC Reference value 1 First reference conversion Short detection: Second reference conversion pins Presample Ch x Convert Ch x Presample Ch x Convert Ch x t Vdd_HV_ADRx Vss_HV_ADRx Note: Either VDD_HV_ADR0/1 or VSS_HV_ADR0/1 can be used as presampling voltage. |
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