AN3077 datasheet(78/82 Pages) STMICROELECTRONICS

78 / 82 page

Revision history

AN3077

78/82

DocID16384 Rev 10

09-Nov-2011

(cont.)

– Updated figures “Logic scheme of the LVDD and HVDD” and “Logic

scheme of the LVD_FLASH, LVD_GPIO and LVD_VREG”

– Updated “Single FCCU pin connected to the external device” section

with updated information to include discussion of both FCCU_F[1]

and FCCU_F[0] instead of just FCCU_F[0].

– Updated operating hours from 12500 hours to 12000 hours in the

“Mission profile” section.

– Updated the definition of 'Safe states' in the “Safe state” section.

– Added a Caution note in the “Flash memory” section about ECC

single-bit correction reporting for the flash memory.

– Added footnote to the “Enhanced Direct Memory Access (eDMA)”

section, “eDMA is a replicated module. No software action is needed

to detect faults inside this module.“

– Added footnote to the “Interrupt Controller (INTC)” section, “INTC is

a replicated module. No software action is needed to detect faults

inside this module.“

– Replaced all instances of “double read” with the correct term “dual

read”.

– Updated all instances of F[0] and F[1] to FCCU_F[0] and

FCCU_F[1], respectively, as shown in the Device_Number

Reference Manual.

– Added NOTE stating: “The temperature profile is an assumption of

the Device_Number safety analysis and shall be fulfilled during

integration into an ASIL D system.” before temperature profile tables

in the “Mission profile” section.

– Changed the “Error Correction Code (ECC) module” heading to

“Error Correction Status Module (ECSM)”.

– Updated all occurrences of RGM to MC_RGM.

– Changed “Fail Safe state” to “Safe state” in entire doc.

– Added NOTE: “The system (for example, ECU) cannot rely on any

pins, other than the Device_Number error output pins (FCCU_F[n]),

when those pins indicate an error.” to the “Error Out Monitor Function

(ERRM)” section.

– Added SEF (Safety Element Function) to the “Acronyms and

abbreviations” table.

– Replaced the text “time of more than one input signal. The signals

are called encoder signals.” with “signal coming from an encoder.” in

the “Read Encoder Inputs” section.

– Changed the Frequency field in the “Software BIST and/or test” table

for the ‘GPI_SWTEST_CMP’ entry to ‘Once for every acquisition’.

– Added “PMU Monitored Supplies” table to the “Power Monitor Unit

(PMU)” section.

– Updated Mandatory paragraph in “Temperature sensors” section to

state that only one temp sensor needs to be read during run time,

instead of both temperature sensors.

– Added these bulleted items to the “Checking” subsection in the

“System Status and Configuration Module (SSCM)” section:

- Decoupled Parallel Mode (DPM) – SSCM_STATUS[LSM] = 0

- Lock Step Mode (LSM) – SSCM_STATUS[LSM] = 1

Table 24. Document revision history (continued)

Date

Revision

Changes

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