STM32F101ZC datasheet(98/112 Pages) STMICROELECTRONICS

98 / 112 page

Electrical characteristics

STM32F101xC, STM32F101xD, STM32F101xE

98/112

Doc ID 14610 Rev 8

IDDVREF+

DAC DC current consumption

in quiescent mode (Standby

mode)

220

µA

With no load, worst code

(0xF1C) at VREF+ = 3.6 V in

terms of DC consumption on

the inputs.

IDDA

DAC DC current consumption

in quiescent mode (Standby

mode)

380

µA

With no load, middle code

(0x800) on the inputs.

480

µA

With no load, worst code

(0xF1C) at VREF+ = 3.6 V in

terms of DC consumption on

the inputs.

DNL(1)

Differential non linearity

Difference between two

consecutive code-1LSB)

±0.5

LSB

Given for the DAC in 10-bit

configuration.

±2

LSB

Given for the DAC in 12-bit

configuration.

INL(1)

Integral non linearity (difference

between measured value at

Code i and the value at Code i

on a line drawn between Code

0 and last Code 1023)

±1

LSB

Given for the DAC in 10-bit

configuration.

±4

LSB

Given for the DAC in 12-bit

configuration.

Offset(1)

Offset error

(difference between measured

value at Code (0x800) and the

ideal value = VREF+/2)

±10

Given for the DAC in 12-bit

configuration.

±3

LSB

Given for the DAC in 10-bit at

VREF+ = 3.6 V.

±12

LSB

Given for the DAC in 12-bit at

VREF+ = 3.6 V.

Gain error(1)

Gain error

±0.5

Given for the DAC in 12bit

configuration.

tSETTLING

(1)

Settling time (full scale: for a

10-bit input code transition

between the lowest and the

highest input codes when

DAC_OUT reaches final value

±1LSB

µs

CLOAD ≤ 50 pF, RLOAD ≥ 5kΩ

Update rate(1)

Max frequency for a correct

DAC_OUT change when small

variation in the input code (from

code i to i+1LSB)

1MS/s CLOAD ≤ 50 pF, RLOAD ≥ 5kΩ

tWAKEUP

(1)

Wakeup time from off state

(Setting the ENx bit in the DAC

Control register)

6.5

µs

CLOAD ≤ 50 pF, RLOAD ≥ 5kΩ

input code between lowest and

highest possible ones.

PSRR+ (2)

Power supply rejection ratio (to

VDDA) (static DC measurement

–67

–40

No RLOAD, CLOAD = 50 pF

Based on characterization, not tested in production.

Guaranteed by design, not tested in production.

Table 59.

DAC characteristics (continued)

Symbol

Parameter

Min

Typ

Max(1)

Unit

Comments

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