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STM32F101ZC датащи(PDF) 94 Page - STMicroelectronics

номер детали STM32F101ZC
подробное описание детали  High-density access line, ARM-based 32-bit MCU
PDF  112 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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STM32F101ZC датащи(HTML) 94 Page - STMicroelectronics

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Electrical characteristics
STM32F101xC, STM32F101xD, STM32F101xE
94/112
Doc ID 14610 Rev 8
The formula above (Equation 1) is used to determine the maximum external impedance
allowed for an error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 56.
RAIN max for fADC = 14 MHz
(1)
1.
Guaranteed by design, not tested in production.
Ts (cycles)
tS (µs)
RAIN max (kΩ)
1.5
0.11
0.4
7.5
0.54
5.9
13.5
0.96
11.4
28.5
2.04
25.2
41.5
2.96
37.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
Table 57.
ADC accuracy - limited test conditions(1)(2)
1.
ADC DC accuracy values are measured after internal calibration.
2.
ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.13 does not
affect the ADC accuracy.
Symbol
Parameter
Test conditions
Typ
Max(3)
3.
Based on characterisation, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 28 MHz,
fADC = 14 MHz, RAIN < 10 kΩ,
VDDA = 3 V to 3.6 V, TA = 25 °C
Measurements made after
ADC calibration
VREF+ = VDDA
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5



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