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ADS7882IPFBT датащи(PDF) 2 Page - Texas Instruments |
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ADS7882IPFBT датащи(HTML) 2 Page - Texas Instruments |
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2 / 29 page ![]() ABSOLUTE MAXIMUM RATINGS ADS7882 SLAS630 – DECEMBER 2008 ........................................................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) NO MISSING MAXIMUM MAXIMUM CODES AT PACKAGE PACKAGE TEMPERATURE ORDERING TRANSPORT MODEL INTEGRAL DIFFERENTIAL RESOLUTION TYPE DESIGNATOR RANGE INFORMATION MEDIA QUANTITY LINEARITY LINEARITY (BIT) ADS7882IPFBT Tape and reel 250 ±4 LSB at 12 bit 48-Pin ADS7882 ±4 LSB at 12 bit 10 PFB –40°C to 85°C (±1 LSB at 10 bit) TQFP ADS7882IPFBR Tape and reel 1000 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. over operating free-air temperature range (unless otherwise noted) (1) VALUE UNIT +IN to AGND –0.3 to +VA + 0.1 V -IN to AGND –0.3 to 0.5 V +VA to AGND –0.3 to 7 V +VBD to BDGND –0.3 to 7 V Digital input voltage to GND –0.3 to (+VBD + 0.3 V) V Digital output to GND –0.3 to (+VBD + 0.3 V) V Operating temperature range –40 to 85 °C Storage temperature range –65 to 150 °C Junction temperature (TJmax) 150 °C Power dissipation (TJ Max–TA)/ θJA TQFP package θ JA Thermal impedance 86 °C/W Vapor phase (60 sec) 215 °C Lead temperature, soldering Infrared (15 sec) 220 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ADS7882 |
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