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MCP4725 датащи(PDF) 25 Page - Microchip Technology |
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MCP4725 датащи(HTML) 25 Page - Microchip Technology |
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25 / 42 page ![]() © 2007 Microchip Technology Inc. DS22039C-page 25 MCP4725 High Speed Mode (Note 5) Clock frequency fSCL 0— 3.4 1.7 MHz MHz Cb = 100 pF Cb = 400 pF Clock high time THIGH 60 120 —— ns ns Cb = 100 pF Cb = 400 pF Clock low time TLOW 160 320 —— ns Cb = 100 pF Cb = 400 pF SCL rise time (Note 1) TR —— 40 80 ns From VIL to VIH,Cb = 100 pF Cb = 400 pF SCL fall time (Note 1) TF —— 40 80 ns From VIH to VIL,Cb = 100 pF Cb = 400 pF SDA rise time (Note 1) TR: DAT —— 80 160 ns From VIL to VIH,Cb = 100 pF Cb = 400 pF SDA fall time (Note 1) TF: DATA —— 80 160 ns From VIH to VIL,Cb = 100 pF Cb = 400 pF START condition hold time THD:STA 160 — — ns After this period, the first clock pulse is generated Repeated START condition setup time TSU:STA 160 — — ns Only relevant for repeated Start condition Data hold time (Note 4) THD:DAT 0 0 —70 150 ns Cb = 100 pF Cb = 400 pF Data input setup time TSU:DAT 10 — — ns STOP condition setup time TSU:STO 160 — — ns STOP condition hold time THD:STD 160 — — ns Output valid from clock (Notes 2 and 3) TAA — — 150 310 ns Cb = 100 pF Cb = 400 pF Bus free time TBUF 160 — — ns Time between START and STOP conditions. TABLE 7-1: I2C SERIAL TIMING SPECIFICATIONS (CONTINUED) Electrical Specifications: Unless otherwise specified, all limits are specified for T A = -40 to +85°C, VDD = +2.7V to +5.0V, VSS = 0V. Parameters Sym Min Typ Max Units Conditions Note 1: This parameter is ensured by characterization and not 100% tested. 2: This specification is not a part of the I2C specification. This specification is equivalent to the Data Hold Time (THD:DAT) plus SDA Fall (or rise) time: TAA = THD:DAT + TF (OR TR). 3: If this parameter is too short, it can create an unintended Start or Stop condition to other devices on the bus line. If this parameter is too long, Clock Low time (TLOW) can be affected. 4: For Data Input: This parameter must be longer than tSP. If this parameter is too long, the Data Input Setup (TSU:DAT) or Clock Low time (TLOW) can be affected. For Data Output: This parameter is characterized, and tested indirectly by testing TAA parameter. 5: All timing parameters in high-speed modes are tested at VDD = 5V. |
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