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RA4M2 датащи(PDF) 66 Page - Renesas Technology Corp |
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RA4M2 датащи(HTML) 66 Page - Renesas Technology Corp |
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66 / 93 page ![]() Table 2.36 A/D conversion characteristics for unit 0 (2 of 2) Conditions: PCLKC = 1 to 50 MHz Parameter Min Typ Max Unit Test conditions High-precision normal-speed channels (AN003 to AN008, AN011 to AN013) Conversion time*1 (Operation at PCLKC = 50 MHz) Permissible signal source impedance Max. = 1 kΩ 0.92 (0.66)*2 — — μs Sampling in 33 states Offset error — ±1.0 ±2.5 LSB — Full-scale error — ±1.0 ±2.5 LSB — Absolute accuracy — ±2.0 ±4.5 LSB — DNL differential nonlinearity error — ±0.5 ±1.5 LSB — INL integral nonlinearity error — ±1.0 ±2.5 LSB — Normal-precision normal-speed channels (AN016) Conversion time*1 (Operation at PCLKC = 50 MHz) Permissible signal source impedance Max. = 1 kΩ 0.92 (0.66)*2 — — μs Sampling in 33 states Offset error — ±1.0 ±5.5 LSB — Full-scale error — ±1.0 ±5.5 LSB — Absolute accuracy — ±2.0 ±7.5 LSB — DNL differential nonlinearity error — ±0.5 ±4.5 LSB — INL integral nonlinearity error — ±1.0 ±5.5 LSB — Note: These specification values apply when there is no access to the external memory during A/D conversion. If access occurs during A/D conversion, values might not fall within the indicated ranges. The use of PORT0 as digital outputs is not allowed when the 12-Bit A/D converter is used. The characteristics apply when AVCC0, AVSS0, VREFH0, VREFL0, and 12-bit A/D converter input voltage are stable. Note 1. The conversion time includes the sampling and comparison times. The number of sampling states is indicated for the test conditions. Note 2. Values in parentheses indicate the sampling time. Table 2.37 A/D internal reference voltage characteristics Parameter Min Typ Max Unit Test conditions A/D internal reference voltage 1.13 1.18 1.23 V — Sampling time 4.15 — — µs — RA4M2 Datasheet 2. Electrical Characteristics R01DS0367EJ0140 Rev.1.40 May 9, 2025 Page 66 of 93 |
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