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CS5535 датащи(PDF) 181 Page - National Semiconductor (TI) |
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CS5535 датащи(HTML) 181 Page - National Semiconductor (TI) |
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181 / 555 page ![]() Revision 0.8 181 www.national.com TAP Controller Functional Description (Continued) 4.20.1 EXTEST The EXTEST instruction accesses the boundary scan chain around the chip and controls the pad logic such that the boundary scan data will control the data and enable signals for the pads. IEEE 1149.1 requires that an all-zero instruction access the boundary scan chain. 4.20.2 TAPSCAN These instructions enable JTAG access to the internal scan associated with a particular CCU clock. TCK will then pro- vide the Scan clock to the CCU so that shifting occurs cor- rectly during the Shift-DR state of the TAP. (See Figure 4- 64 and Figure 4-65.) 4.20.3 TAPFUNC These instructions connect TDI and TDO to the 1-bit bypass register during DR access. They are useful in that during the Capture-DR state, one functional clock can be applied to the specific CCU clock indicated by the instruc- tion. This mode works well with the FS2 JTAG control soft- ware available with CS5535. The Scan Enable signal to the block will be inactive during this clock. Figure 4-64. TAP Controller and Parallel Scan Mode Test Mode = 1 Scan In Scan Out Pad Pad GeodeLink™ Device TAP Scan In Pad |
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