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CS5535 датащи(PDF) 179 Page - National Semiconductor (TI) |
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CS5535 датащи(HTML) 179 Page - National Semiconductor (TI) |
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179 / 555 page ![]() Revision 0.8 179 www.national.com TAP Controller Functional Description (Continued) Table 4-38. TAP Controller Instructions Instruction DR Length IR Name Description 000000h and FFFFE8h 240 EXTEST Boundary Scan Ring. IEEE 1149.1 specification compliant. (Mapped twice in IR address space.) 01FFFAh through 1DFFFAh Variable TAPSCAN[0:28] TAP Scan Chain 0 through Chain 28. These are parts of the internal scan chain subdivided according to a common CCU clock. 01FFFFh through 1DFFFFh 1 TAPFUNC[0:28] TAP Function Chain 0 through Chain 28. One capture cycle applied to the individual CCU scan chain clocked by the func- tional clock. 81FFFAh 70 GL_ADDR GeodeLink Address. Access GeodeLink request packet and data packet control bits. 83FFFAh 66 GL_DATA GeodeLink Data. Access GeodeLink data. 85FFFAh 4 PADACC Pad Access. Padtestmode for access to analog and memory BIST signals. 87FFFAh 24 PROGMISR Program instruction. This instruction provides direct access to an MSR used for the ROM memory BIST test. Not supported. 8BFFFAh 70 GL_ADDR_ACT GeodeLink Address Action. Same data register as GL_ADDR, but no GeodeLink transactions are triggered by the access - only by GLCP debug action. 8DFFFAh -- TST_IDDQ Test IDDQ. Put chip in a mode for running IDDQ tests. 8FFFFAh 8 REVID Revision ID. The TAP instruction used to access the current revision code (8 bits) for the chip. FFFFDFh 1 TRISTATE TRI-STATE. Put chip into TRI-STATE and comparison mode. FFFFFDh 21 BISTDR Parallel RAM BIST. Internal data register (for chip test). FFFFFEh 32 IDCODE ID Code. 0FE1101Fh for CS5535. MSB LSB ID[31:28] ID27 ID[12:11] ID[1:0] Version Part Number Manuf. ID 1 FFFFFFh 1 BYPASS Bypass. IEEE 1149.1 specification requires all 1s to be bypassed. |
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