Symbol

Parameter

Test condition

Min

Typ

Max

Unit

DIS_in_ll_th

Low input voltage range

-

-

-

0.8

V

DIS_in_pd

Internal pull down current

Pin = 3.3 V

20

40

60

μA

DIS_flt

Disable pin filter time

Guaranteed by scan

1.6

-

3

us

4.2

Fault management

In the next paragraphs all device functions related to faults handing are described.

4.2.1

Fault table

In the following table all the faults causing an alarm on FLT pin, with proper filter time, are listed.

To clear a latched fault, the WAKE pin has to be set low for its filter time (1 ms) and then set again to high for its

filter time; after that a new power-up sequence can start.

Table 18. Fault table

Event

Filter time

HGATE

DGATE

FLT

Latched

Action for

coming back to

operating

Scenario

OV

10 μs

Low

Low

Active

Not

OV disappears

and no other

faults present

Input overvoltage

starting from device

ON condition

UV

100 μs

Low

Low

Active

Not

UV disappears

Input undervoltage

starting from device

ON condition

HOTSWAP VDS

detection

1 ms

Low

Low

Active

Yes

Toggling WAKE

After softstart finish,

M1 is open

ORING VDS

detection

1 ms

Low

Low

Active

Yes

Toggling WAKE

M2 VDS short

Overcurrent

1/100 μs

Low

Low

Active

Latched

after 32

retries

Toggling WAKE

Output overcurrent

STG

10 μs

No effect

No effect

Active

Not

N.A.

Output short to a lower

fixed voltage level

VB < VOUT

10 μs

High

(VDS

masked)

Low

(VDS

masked)

Not

active

Not

Reverse battery

condition

VB<VOUT

disappear

Reverse current

VBAT < Vout

CP_UV

10 μs

Low

Low

Active

Not

If CP_UV

disappears

UV on charge pump

- VGS on MOSFETs

cannot be guaranteed

OT

10 μs

Low

Low

Active

Not

If OT disappears

Over-temperature

detected

DIS

3 μs Max

Low

Low

Active

Not

If DIS is not

active

DIS pin is not asserted

SAFETY_FAULT

100 μs fault

detection

Low

Low

Active

Yes

Toggling WAKE

Selftest fail or clock

monitor error or OTP

CRC fail

If a reverse condition (VB < VOUT) is detected, VDS comparators of Oring and hot swap are both masked to

avoid false detection.

Pre-driver VDS diagnostic is implemented and optimized to work with a recommended bill of material (see

Table 24).

STPM801

Fault management

DS13990 - Rev 2

page 20/38