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ADAF1080BCPZ датащи(PDF) 27 Page - Analog Devices |
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ADAF1080BCPZ датащи(HTML) 27 Page - Analog Devices |
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27 / 36 page ![]() Data Sheet ADAF1080 APPLICATIONS INFORMATION analog.com Rev. 0 | 27 of 36 Figure 54. Synchronization of the ADAF1080 and the ADC Sampling for Slow Sampling Rate Applications that do not require precision performance at low fre- quencies can disable the chopping functionality of the integrated PGIA by tying the SYNC pin to VDD. When the chopping feature of the PGIA is disabled, the full bandwidth of the PGIA can be used for settling; however, higher flicker noise at lower frequencies is observed. Refer to Figure 37 and Figure 36 for PGIA noise performance with and without chopping. Table 15 outlines the different modes available for the integrated amplifier. Table 15. SYNC Pin Functionality SYNC Pin State SYNC_EN Pin Instrumentation Amplifier Chopping Functionality VDD Don’t care Chopping disabled GND Don’t care Internal 200 kHz chopping 400 kHz < fSYNC < 1.6 MHz Low Internal 200 kHz chopping 400 kHz < fSYNC < 1.6 MHz High fSYNC/4 chopping If the SYNC and SYNC_EN pins are left floating, two internal 300 kΩ pull-downs ensure that the amplifier is chopping at 200 kHz as a default condition. ELECTRICAL OFFSET CANCELLATION The integrated flip coil driver can be used to reverse the sensitivity polarity so that all error sources related to the electrical offset and offset drift of the AMR sensor and signal conditioning circuit can be calibrated out of the sense magnetic field measurement. For one time offset cancellation, in the presence of constant or low frequency magnetic fields, two measurements can be made with reverse states of the flip coil. The offset can then be calculated directly by the following equation: VOFFSET=VOUTFn+VOUTFp 2 −VSET2 (8) where: VOUTFn is the output of the ADAF1080 when FLIP_DRV is GND. VOUTFp is the output of theADAF1080 when FLIP_DRV is VDD. VSET is the voltage on the VSET pin. Once the electrical offset is measured, this offset can be canceled in any further measurements as shown in the following equation: VOUT_OC=VOUT−VSET2−VOFFSET (9) where VOUT_OC is the offset canceled output voltage of the ADAF1080. For periodic offset cancellation, the flip coil can be reversed at a fixed frequency, and the offset and offset drift can be removed by using the following equation: VOUT_OC=VOUTFn−VOUTFp 2 (10) When using the flip coil driver, sampling of the output must take place after the settling time of the sensor (tSETTLING) is complete, as shown in the Flip Coil and Measurement Timing section. EXAMPLE OFFSET CALCULATION The example offset calculation is an example where a 1 mT external field (BEXT) is applied along the sense field axis of the ADAF1080 as shown in Figure 47. In this example, the following is assumed: ► A0 and A1 = VDD, G = 80 ► VDD = VSET = 5 V and SCOEFF1 = 199.25 mV/mT based on the typical value for the ±2 mT magnetic range ► The electrical offset of the ADAF1080 and its signal chain is 2 mV In this setup, the expected output of the ADAF1080 is the following when FLIP_DRV = GND: VOUTFn= ‐199.25 mVmT×1 mT+5 V2+2 mV=2.303 V (11) In this setup, the expected output of the ADAF1080 is the following when FLIP_DRV = VDD: VOUTFp= 199.25 mVmT×1 mT+5 V2+2 mV=2.701 V (12) By combining these two measurements, the electrical offset can then be calculated as follows: VOFFSET= VOUTFn+VOUTFp 2 −VSET2=2.502 V−5 V2=2 mV (13) Once the electrical offset is calculated, the result can be used for all future measurement as shown as follows to remove electrical offset errors from the output magnetic sense field measurements: VOUT_OC=VOUT−VSET2−VOFFSET (14) |
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