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ADAF1080BCPZ датащи(PDF) 27 Page - Analog Devices

номер детали ADAF1080BCPZ
подробное описание детали  Integrated 8 mT AMR Magnetic Field Sensor and Signal Conditioner
PDF  36 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
Logo AD - Analog Devices

ADAF1080BCPZ датащи(HTML) 27 Page - Analog Devices

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Data Sheet
ADAF1080
APPLICATIONS INFORMATION
analog.com
Rev. 0 | 27 of 36
Figure 54. Synchronization of the ADAF1080 and the ADC Sampling for Slow
Sampling Rate
Applications that do not require precision performance at low fre-
quencies can disable the chopping functionality of the integrated
PGIA by tying the SYNC pin to VDD. When the chopping feature
of the PGIA is disabled, the full bandwidth of the PGIA can be
used for settling; however, higher flicker noise at lower frequencies
is observed. Refer to Figure 37 and Figure 36 for PGIA noise
performance with and without chopping.
Table 15 outlines the different modes available for the integrated
amplifier.
Table 15. SYNC Pin Functionality
SYNC Pin State
SYNC_EN Pin
Instrumentation Amplifier
Chopping Functionality
VDD
Don’t care
Chopping disabled
GND
Don’t care
Internal 200 kHz chopping
400 kHz < fSYNC <
1.6 MHz
Low
Internal 200 kHz chopping
400 kHz < fSYNC <
1.6 MHz
High
fSYNC/4 chopping
If the SYNC and SYNC_EN pins are left floating, two internal
300 kΩ pull-downs ensure that the amplifier is chopping at 200 kHz
as a default condition.
ELECTRICAL OFFSET CANCELLATION
The integrated flip coil driver can be used to reverse the sensitivity
polarity so that all error sources related to the electrical offset and
offset drift of the AMR sensor and signal conditioning circuit can be
calibrated out of the sense magnetic field measurement.
For one time offset cancellation, in the presence of constant or low
frequency magnetic fields, two measurements can be made with
reverse states of the flip coil. The offset can then be calculated
directly by the following equation:
VOFFSET=VOUTFn+VOUTFp
2
−VSET2
(8)
where:
VOUTFn is the output of the ADAF1080 when FLIP_DRV is GND.
VOUTFp is the output of theADAF1080 when FLIP_DRV is VDD.
VSET is the voltage on the VSET pin.
Once the electrical offset is measured, this offset can be canceled
in any further measurements as shown in the following equation:
VOUT_OC=VOUT−VSET2−VOFFSET
(9)
where VOUT_OC is the offset canceled output voltage of the
ADAF1080.
For periodic offset cancellation, the flip coil can be reversed at a
fixed frequency, and the offset and offset drift can be removed by
using the following equation:
VOUT_OC=VOUTFn−VOUTFp
2
(10)
When using the flip coil driver, sampling of the output must take
place after the settling time of the sensor (tSETTLING) is complete, as
shown in the Flip Coil and Measurement Timing section.
EXAMPLE OFFSET CALCULATION
The example offset calculation is an example where a 1 mT
external field (BEXT) is applied along the sense field axis of the
ADAF1080 as shown in Figure 47.
In this example, the following is assumed:
►
A0 and A1 = VDD, G = 80
►
VDD = VSET = 5 V and SCOEFF1 = 199.25 mV/mT based on the
typical value for the ±2 mT magnetic range
►
The electrical offset of the ADAF1080 and its signal chain is
2 mV
In this setup, the expected output of the ADAF1080 is the following
when FLIP_DRV = GND:
VOUTFn=
‐199.25 mVmT×1 mT+5 V2+2 mV=2.303 V (11)
In this setup, the expected output of the ADAF1080 is the following
when FLIP_DRV = VDD:
VOUTFp=
199.25 mVmT×1 mT+5 V2+2 mV=2.701 V (12)
By combining these two measurements, the electrical offset can
then be calculated as follows:
VOFFSET=
VOUTFn+VOUTFp
2
−VSET2=2.502 V−5 V2=2 mV (13)
Once the electrical offset is calculated, the result can be used for all
future measurement as shown as follows to remove electrical offset
errors from the output magnetic sense field measurements:
VOUT_OC=VOUT−VSET2−VOFFSET
(14)



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