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IN100-Q1-R-RC1F датащи(PDF) 26 Page - List of Unclassifed Manufacturers |
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IN100-Q1-R-RC1F датащи(HTML) 26 Page - List of Unclassifed Manufacturers |
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26 / 49 page ![]() 25 / 47 www.inplay-tech.com N1EDOC-DS-IN100-EN-V1.3 Figure 10: Load switch pins These switches can be automatically turned on or off when the sensor ADC is measuring external analog signals through a mixed-signal GPIO pin or when the pulse counting/PWM detection logic is running to count pulses on the GPIO pins. 4.6. Random number generator A 64-bit random number generator based on a linear feedback shift register (LFSR) is provided. The initial value of the LFSR is obtained from the least-significant bits of multiple sensor ADC channels and the initial value from the SRAM readout. The random values can be used in resolvable and non-resolvable address generation or the random number value in an advertising packet payload. 4.7. Timers (Always-on domain) A 32-bit count-down timer and a 64-bit count-up timer are provided in the always-on power domain running with the 32kHz sleep clock. The 64-bit count-up timer value can be converted to units of 0.1s, 1s or customized unit values. Another 32-bit watch dog timer is also provided which can be used to reset the device upon expiration. 4.8. Sleep and wake-up settings Once VCC power is provided and the CHIP_EN pin is asserted, the device will start working according to the eFuse memory settings. If there is no valid eFuse memory settings present, an external MCU can control and configure the device through the UART interface. The device can go to sleep automatically after event checking or transmission based on configuration. In this mode, the chip will also automatically wake itself up after the given time. During sleep, the contents of the 4Kbyte memory will be retained. If automatic sleep is not |
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