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SPC572L64F2 датащи(PDF) 41 Page - STMicroelectronics |
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SPC572L64F2 датащи(HTML) 41 Page - STMicroelectronics |
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41 / 112 page ![]() DocID027866 Rev 5 41/112 SPC572Lx Electrical characteristics 111 1. PLL0IN clock retrieved directly from either Internal RC Oscillator (IRCOSC) or External Oscillator (XOSC) clock. Input characteristics are granted when using XOSC. 2. fPLL0IN frequency must be scaled down using PLLDIG_PLL0DV[PREDIV] to ensure PFD input signal is in the range of 8MHz-20MHz. 3. VDD_LV noise due to application in the range VDD_LV = 1.25 V ± 5% with frequency below PLL bandwidth (40 kHz) is filtered. Table 21. External oscillator electrical specifications Symbol C Parameter Conditions Value Unit Min Max fXTAL CC D Crystal frequency range(1) — — — 48 MHz > 8 20 > 20 40 tcst CC T Crystal start-up time(2)(3) —— 5 ms trec CC T Crystal recovery time(4) —— 0.5 ms VIHEXT CC D EXTAL input high voltage (External Reference) VREF = 0.28 * VDD_HV_IO_JTAG VREF + 0.6 — V VILEXT CC D EXTAL input low voltage(5) VREF = 0.28 * VDD_HV_IO_JTAG —VREF - 0.6 V CS_EXTAL CC T Total on-chip stray capacitance on EXTAL pin — — 2.5 + value from Table 22 pF CS_XTAL CC T Total on-chip stray capacitance on XTAL pin — — 2.5 + value from Table 22 pF gm CC D Oscillator Transconductance TJ =-40 °C to 150 °C 4.5 V < VDD_HV_IO < 5.5 V fXTAL ≤ 8MHz 2.6 11.0 mA/V DfXTAL ≤ 20 MHz 7.9 26.0 DfXTAL ≤ 40 MHz 10.4 34.0 IXTAL CC D XTAL current(6) TJ = 150 °C — 14 mA VHYS CC D Comparator Hysteresis TJ = 150 °C 0.1 1.0 V 1. The range is selectable by DCF record. 2. This value is determined by the crystal manufacturer and board design. 3. Proper PC board layout procedures must be followed to achieve specifications. 4. Crystal recovery time is the time for the oscillator to settle to the correct frequency after adjustment of the integrated load capacitor value. 5. Applies to an external clock input and not to crystal mode. 6. IXTAL is the oscillator bias current out of the XTAL pin with both EXTAL and XTAL pins grounded. Test circuit is shown in Figure 11. |
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