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SPC572L64F2 датащи(PDF) 102 Page - STMicroelectronics |
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SPC572L64F2 датащи(HTML) 102 Page - STMicroelectronics |
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102 / 112 page ![]() Revision history SPC572Lx 102/112 DocID027866 Rev 5 6 Revision history Table 55 summarizes revisions to this document. Table 55. Document revision history Date Revision Changes 18-Jul- 2012 1 Initial release. 03-Apr-2013 2 Formatting and editorial changes throughout document. Table 2: SPC572Lx device feature summary: Changed title (was SPC5726SPC572L64 device feature summary) Figure 2 (Periphery allocation): Removed BAR module from diagram. Section 1.5, Features overview: Added detail to PIT descriptions (2 bullets). Added Saturation Instructions Extension... feature item. Figure 4 (100-pin QFP configuration (top view)): Changed pin 65 to “ESR1” Table 3 (Power supply and reference pins): For row VDD_LV: added pin 68 for 100 pin and 80 pin packages. Section 2.2.1, Power supply and reference voltage pins: Added 2 sentences starting from “The Supply Pins Table contains...” Table 5 (Port pins description): From PC[10] to PC[15] - changed VDD_HV_IO_FLEX to VDD_HV_IO_ETH Table 7 (Absolute maximum ratings): Added footnote VDD_HV_IO refers to... Section 2.2.1, Power supply and reference voltage pins: Added 2 sentences starting from The Supply Pins Table contains... Table 8 (ESD ratings,): Added classification column Table 9 (Device operating conditions): Removed rows VDD_HV_ADR_D and VDD_HV_ADR_S For row VDD_HV_ADR: divided Value Min column data into “C” (3.0) and “P” (4.0) values and added the word reference to the Parameter description column Changed row VSS_HV_ADR symbol (was VSS_HV_ADR_D) Changed VDD_HV_ADV Value Min column data for P characteristic to 4.0 (was 4.2) Table 9 (Device operating conditions): For row VDD_HV_ADR: inverted the C and P Parameter Classification values. Table 10 (DC electrical specifications): Removed the following rows: VDD_HV_IO, VDD_HV_IO_JTAG, VDD_HV_IO_ETH, VDD_HV_ADV, VDD_HV_ADR, VDD_HV_ADR – VDD_HV_ADV Table 12 (I/O input DC electrical characteristics): In row VIHTTL condition changed to 4.5 V < VDD_HV_IO <5.5 V. In row VILTTL condition changed to 4.5 V < VDD_HV_IO <5.5 V. In row VHYSTTL condition changed to 4.5 V < VDD_HV_IO <5.5 V. In row VIHCMOS_H condition changed to 2.7 V < VDD_HV_IO < 3.0 V and 4.0 V < VDD_HV_IO <4.5 V. In row VIHCMOS condition changed to 2.7 V < VDD_HV_IO < 3.0 V and 4.0 V < VDD_HV_IO <4.5 V. In row VILCMOS_H condition changed to 2.7 V < VDD_HV_IO < 3.0 V and 4.0 V < VDD_HV_IO <4.5 V. In row VHYSCMOS condition changed to 2.7 V < VDD_HV_IO < 3.0 V and 4.0 V < VDD_HV_IO <4.5 V. |
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