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STM32G031F6 датащи(PDF) 69 Page - STMicroelectronics |
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STM32G031F6 датащи(HTML) 69 Page - STMicroelectronics |
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69 / 117 page ![]() DS12992 Rev 2 69/117 STM32G031x4/x6/x8 Electrical characteristics 92 5.3.13 I/O current injection characteristics As a general rule, current injection to the I/O pins, due to external voltage below VSS or above VDDIO1 (for standard, 3.3 V-capable I/O pins) should be avoided during normal product operation. However, in order to give an indication of the robustness of the microcontroller in cases when abnormal injection accidentally happens, susceptibility tests are performed on a sample basis during device characterization. Functional susceptibility to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out-of-range parameter: ADC error above a certain limit (higher than 5 LSB TUE), induced leakage current on adjacent pins out of conventional limits (-5 µA/+0 µA range) or other functional failure (for example reset occurrence or oscillator frequency deviation). Negative induced leakage current is caused by negative injection and positive induced leakage current is caused by positive injection. Table 50. I/O current injection susceptibility(1) Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on pin All except PA1, PA3, PA5, PA6, PA13, PB0, PB1, PB2, and PB8 -5 N/A mA PA1, PA5, PA13, PB1, PB2 0 +5 / N/A(2) PA3, PA6, PB0 -5 +5 / N/A(2) PB8 0 N/A 1. Based on characterization results, not tested in production. 2. The injection current value is applicable when the switchable diode is activated, N/A when not activated. |
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