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STM32G031F6 датащи(PDF) 69 Page - STMicroelectronics

номер детали STM32G031F6
подробное описание детали  Arm® Cortex®-M0 32-bit MCU, up to 64 KB Flash, 8 KB RAM, 2x USART, timers, ADC, comm. I/Fs, 1.7-3.6V
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производитель  STMICROELECTRONICS [STMicroelectronics]
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STM32G031F6 датащи(HTML) 69 Page - STMicroelectronics

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STM32G031x4/x6/x8
Electrical characteristics
92
5.3.13
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDDIO1 (for standard, 3.3 V-capable I/O pins) should be avoided during normal
product operation. However, in order to give an indication of the robustness of the
microcontroller in cases when abnormal injection accidentally happens, susceptibility tests
are performed on a sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out-of-range parameter: ADC error above a certain limit
(higher than 5 LSB TUE), induced leakage current on adjacent pins out of conventional
limits (-5 µA/+0 µA range) or other functional failure (for example reset occurrence or
oscillator frequency deviation).
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
Table 50. I/O current injection susceptibility(1)
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on
pin
All except PA1, PA3, PA5, PA6,
PA13, PB0, PB1, PB2, and PB8
-5
N/A
mA
PA1, PA5, PA13, PB1, PB2
0
+5 / N/A(2)
PA3, PA6, PB0
-5
+5 / N/A(2)
PB8
0
N/A
1. Based on characterization results, not tested in production.
2. The injection current value is applicable when the switchable diode is activated, N/A when not activated.



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