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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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TLE9255WLC датащи(PDF) 93 Page - Infineon Technologies AG |
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TLE9255WLC датащи(HTML) 93 Page - Infineon Technologies AG |
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93 / 100 page  Data Sheet 93 Rev. 1.02 2018-02-02 TLE9255W Application Information 11 Application Information 11.1 ESD Robustness according to IEC 61000-4-2 Tests for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330 Ω) have been performed. The results and test conditions are available in a separate test report. Table 23 ESD robustness according to IEC61000-4-2 Performed Test Result Unit Remarks Electrostatic discharge voltage at pin VBAT, CANH, CANL and WAKE1) versus GND 1) 10 nF capacitor and 3.3 kΩ resistor required (see Figure 53). ≥ +10 kV 2)Positive pulse 2) ESD susceptibility “ESD GUN” according to GIFT / ICT paper: “EMC Evaluation of CAN Transceivers, IEC TS 62228”, section 4.3. (DIN EN 61000-4-2) Tested by external test facility (IBEE Zwickau, EMC test report). Electrostatic discharge voltage at pin VBAT, CANH, CANL and WAKE1) versus GND ≤ -10 kV 2)Negative pulse |
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