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LTC2435-1IGN датащи(PDF) 27 Page - Linear Technology |
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LTC2435-1IGN датащи(HTML) 27 Page - Linear Technology |
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27 / 40 page ![]() LTC2435/LTC2435-1 27 24351fa APPLICATIO S I FOR ATIO tance driving IN+ or IN–. When FO is driven by an external oscillator with a frequency fEOSC (external conversion clock operation), the typical differential input resistance is 3.3 • 1012/fEOSCΩ and each ohm of source resistance driving IN+ or IN– will result in 0.15 • 10–6 • fEOSC ppm +FS gain error. The effect of the source resistance on the two input pins is additive with respect to this gain error. The typical +FS and –FS errors as a function of the sum of the source resistance seen by IN+ and IN– for large values of CIN are shown in Figures 18 and 19. In addition to this gain error, an offset error term may also appear. The offset error is proportional to the mismatch between the source impedance driving the two input pins IN+ and IN– and with the difference between the input and reference common mode voltages. While the input drive circuit nonzero source impedance combined with the converter average input current will not degrade the INL performance, indirect distortion may result from the modu- lation of the offset error by the common mode component of the input signal. Thus, when using large CIN capacitor values, it is advisable to carefully match the source imped- ance seen by the IN+ and IN– pins. When FO = LOW (internal oscillator and 60Hz notch), every 1Ω mismatch in source impedance transforms a full-scale common mode input signal into a differential mode input signal of 0.023ppm. When FO = HIGH (internal oscillator and 50Hz notch), every 1Ω mismatch in source impedance trans- forms a full-scale common mode input signal into a differential mode input signal of 0.02ppm. When FO is driven by an external oscillator with a frequency fEOSC, every 1Ω mismatch in source impedance transforms a full-scale common mode input signal into a differential mode input signal of 0.15 • 10–6 • fEOSCppm. Figure 20 shows the typical offset error due to input common mode voltage for various values of source resistance imbalance between the IN+ and IN– pins when large CIN values are used. If possible, it is desirable to operate with the input signal common mode voltage very close to the reference signal common mode voltage as is the case in the ratiometric measurement of a symmetric bridge. This configuration eliminates the offset error caused by mismatched source impedances. The magnitude of the dynamic input current depends upon the size of the very stable internal sampling capacitors and upon the accuracy of the converter sampling clock. The accuracy of the internal clock over the entire temperature and power supply range is typical better than 0.5%. Such a specification can also be easily achieved by an external clock. When relatively stable resistors (50ppm/°C) are used for the external source impedance seen by IN+ and IN–, the expected drift of the dynamic current, offset and Figure 18. +FS Error vs RSOURCE at IN+ or IN– (Large CIN) Figure 19. –FS Error vs RSOURCE at IN+ or IN– (Large CIN) Figure 20. Offset Error vs Common Mode Voltage (VINCM = VIN+ = VIN–) and Input Source Resistance Imbalance (∆RIN = RSOURCEIN+ – RSOURCEIN–) for Large CIN Values (CIN ≥ 1µF) RSOURCE (Ω) 0 –10 –20 –30 –40 –50 –60 –70 –80 –90 –100 2435 F18 0 400 800 1200 1600 2000 VCC = 5V VREF+ = 5V VREF– = GND VIN+ = 3.75V VIN– = 1.25V FO = GND TA = 25°C CIN = 1µF, 10µF CIN = 0.01µF CIN = 0.1µF RSOURCE (Ω) 100 90 80 70 60 50 40 30 20 10 0 2435 F19 0 400 800 1200 1600 2000 VCC = 5V VREF+ = 5V VREF– = GND VIN+ = 1.25V VIN– = 3.75V FO = GND TA = 25°C CIN = 1µF, 10µF CIN = 0.01µF CIN = 0.1µF A B C D E F G VINCM (V) 0 –310 –320 –330 –340 –350 –360 –370 –380 2435 F20 2.0 5.0 1.0 3.0 4.0 0.5 2.5 1.5 3.5 4.5 VCC = 5V VREF+ = 5V VREF– = GND VIN+ = VIN– = VINCM A: ∆RIN = 1k B: ∆RIN = 500Ω C: ∆RIN = 200Ω D: ∆RIN = 0Ω E: ∆RIN = –200Ω F: ∆RIN = –500Ω G: ∆RIN = –1k FO = GND TA = 25°C CIN = 10µF |
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