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LTC2435-1IGN датащи(PDF) 25 Page - Linear Technology |
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LTC2435-1IGN датащи(HTML) 25 Page - Linear Technology |
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25 / 40 page ![]() LTC2435/LTC2435-1 25 24351fa APPLICATIO S I FOR ATIO Driving the Input and Reference The input and reference pins of the LTC2435/LTC2435-1 converters are directly connected to a network of sampling capacitors. Depending upon the relation between the differential input voltage and the differential reference voltage, these capacitors are switching between these four pins transferring small amounts of charge in the process. A simplified equivalent circuit is shown in Figure 14. For a simple approximation, the source impedance RS driving an analog input pin (IN+, IN–, REF+ or REF–) can be considered to form, together with RSW and CEQ (see Figure 14), a first order passive network with a time constant τ = (RS + RSW) • CEQ. The converter is able to sample the input signal with better than 1ppm accuracy if the sampling period is at least 14 times greater than the input circuit time constant τ. The sampling process on the four input analog pins is quasi-independent so each time constant should be considered by itself and, under worst- case circumstances, the errors may add. When using the internal oscillator (FO = LOW or HIGH), the LTC2435’s front-end switched-capacitor network is clocked at 76800Hz corresponding to a 13µs sampling period and the LTC2435-1’s front end is clocked at 69900Hz corre- sponding to 14.2µs. Thus, for settling errors of less than 1ppm, the driving source impedance should be chosen such that τ ≤ 13µs/14 = 920ns (LTC2435) and τ <14.2µs/ 14 = 1.01µs (LTC2435-1). When an external oscillator of frequency fEOSC is used, the sampling period is 2/fEOSC and, for a settling error of less than 1ppm, τ ≤ 0.14/fEOSC. Input Current If complete settling occurs on the input, conversion re- sults will be unaffected by the dynamic input current. An incomplete settling of the input signal sampling process may result in gain and offset errors, but it will not degrade the INL performance of the converter. Figure 14 shows the mathematical expressions for the average bias currents flowing through the IN+ and IN– pins as a result of the sampling charge transfers when integrated over a sub- stantial time period (longer than 64 internal clock cycles). The effect of this input dynamic current can be analyzed using the test circuit of Figure 15. The CPAR capacitor includes the LTC2435/LTC2435-1 pin capacitance (5pF typical) plus the capacitance of the test fixture used to obtain the results shown in Figures 16 and 17. A careful implementation can bring the total input capacitance (CIN + CPAR) closer to 5pF thus achieving better performance than the one predicted by Figures 16 and 17. For simplic- ity, two distinct situations can be considered. For relatively small values of input capacitance (CIN < 0.01µF), the voltage on the sampling capacitor settles almost completely and relatively large values for the source impedance result in only small errors. Such values for CIN will deteriorate the converter offset and gain performance without significant benefits of signal filtering and the user is advised to avoid them. Nevertheless, when small values of CIN are unavoidably present as parasitics of input multiplexers, wires, connectors or sensors, the LTC2435/LTC2435-1 can maintain their exceptional accu- racy while operating with relative large values of source resistance as shown in Figures 16 and 17. These mea- sured results may be slightly different from the first order approximation suggested earlier because they include the effect of the actual second order input network together with the nonlinear settling process of the input amplifiers. For small CIN values, the settling on IN+ and IN– occurs almost independently and there is little benefit in trying to match the source impedance for the two pins. Larger values of input capacitors (CIN > 0.01µF) may be required in certain configurations for antialiasing or gen- eral input signal filtering. Such capacitors will average the input sampling charge and the external source resistance will see a quasi constant input differential impedance. When FO = LOW (internal oscillator and 60Hz notch), the typical differential input resistance is 22MΩ (LTC2435) or 24MΩ (LTC2435-1) which will generate a +FS gain error of approximately 0.023ppm (LTC2435) or 0.021ppm (LTC2435-1) for each ohm of source resistance driving IN+ or IN–. For the LTC2435, when FO = HIGH (internal oscillator and 50Hz notch), the typical differential input resistance is 26MΩ which will generate a +FS gain error of approximately 0.019ppm for each ohm of source resis- |
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