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L9659 датащи(PDF) 40 Page - STMicroelectronics

номер детали L9659
подробное описание детали  Octal squib driver ASIC for safety application
PDF  51 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9659 датащи(HTML) 40 Page - STMicroelectronics

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Functional description
L9659
40/51
Doc ID 022048 Rev 2
Bits D8:D7
The definition of the response bits will change as follows based on
diagnostic select
STB/STG bit Definition with MOSI D11:D9=001 (Leakage Test)
STB bit
Bit used for indicating leakage to battery.
0 = No leakage to battery
1 = Short to battery / HS Driver test pass
STG bit Bit used for indicating leakage to ground.
0 = No leakage to battery
1 = Short to ground / LS Driver test pass
STB/STG bit Definition with MOSI D11:D9=110 (LS FET)
STB, STG bits see table below
Table 20.
Diagnostic selection
Diagnostic
Bits
Current source
active
Comparator or
amplifier
D11
D10
D9
Stop Diagnostic
0
0
0
NO
NO
Short to Battery/Ground and
short between loops
0
0
1
Y (VMRC)
Y (Comp
ISTB/ISTG)
VRESx Diagnostic
0
1
0
N
Y (Comp VRESx)
High Side Safing Diagnostics
0
1
1
Y (IHSS)
Y (Comp HSS)
Squib Resistance Diagnostics
1
0
0
Y (ISRC/ISINK)
Y (Ampli )
High Squib Resistance
Diagnostics
1
0
1
Y (VMRC/ISINK)
Y (Comp IHR)
LS FET test
1
1
0
Y (VMRC)
Y (Comp
ISTB/ISTG)
HS FET test
1
1
1
Y (VMRC)
Y (Comp
ISTB/ISTG)
Table 21.
Diagnostic mode LS FET selection
Condition
STB
STG
Test in Process (FT=1); Fault present prior to run test (FP=1); or LS
FET/GNDx open fault (FP=0,FT=0). Only Valid if test is in process
or inactive.
0
0
Short to battery occurred during test.
1
0
Test Pass if leakage diagnostics did not indicate a short to Gnd.
0
1



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