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L9659 датащи(PDF) 28 Page - STMicroelectronics

номер детали L9659
подробное описание детали  Octal squib driver ASIC for safety application
PDF  51 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9659 датащи(HTML) 28 Page - STMicroelectronics

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Functional description
L9659
28/51
Doc ID 022048 Rev 2
on the channel under test and all other channels. During the test with no leakage present
the voltage on the selected SQHx or SQLx pin will be equal to VBIAS and no current is sunk
or sourced by VRCM. If a leakage to ground, battery or to SQLy is present, the VRCM will
sink or source a current less then ISVRCM trying to keep VBIAS. Two current comparators,
ISTB and ISTG, will detect the abnormal current flow.
Loop to loop diagnostics
For this test the same procedure is followed except the pulldown current (IPD) is selected to
be ON which will deactivate the pulldown current only on the channel under test with all
other channel pulldown currents active. If a short to ground fault is active, assuming it was
not active during normal short to battery/ground diagnostics, then that particular channel
has a short to another squib loop. To detect loop to loop shorts between ASICs in the
system the Stop diagnostics command with IPD enabled needs to be sent to the other
ASICs before running the loop to loop diagnostics on the channel to be monitored. If the
channel being monitored has a short to ground fault active, assuming it was not active
during normal short to battery/ground diagnostics, then that particular channel has a short
to another squib loop in the system.
The following table indicated how faults would be interpreted.
Once the command is issued the state of the comparators will be captured on the next
falling edge of CS_D. The results are valid after TSHORTDIAG time, which is mainly
dependant on the external capacitors on the squib lines.
Squib resistance measurement
During a resistance measurement, both ISRC and ISINK are switched on and connected to
the selected SQHx and SQLx channel. A differential voltage is created between the SQHx
and SQLx pin based in the ISRC current and resistance between the pins. The analog
output pin, AOUT, will provide the resistance-measurement voltage based on the scaling
factor indicated in the electrical parameters section. The tri-state output, AOUT, will be
connected to an ADC input of a microprocessor. When not running squib resistance
diagnostics the AOUT pin will be high impedance.
To increase accuracy of the squib resistance measurements the offset of the internal
amplifier can be provided on the AOUT pin. This is done by setting the appropriate
calibration bit, waiting the required time, and reading the converted AOUT voltage
connected to the microprocessor ADC.
The normal measurement method for squib resistance is to take a single ended analog
output measurement for a channel (VAOUT with AMC bit=0) and use the tolerances and
Table 11.
How faults shall be interpreted
Fault condition for
channel(1)
1.
Condition where 4 open channels have the SQHx pins shorted will not be detected. If one squib is open
and the other has a normal squib connection then the fault will be indicated on the channel that is open.
Assumes both pins are tested
Channel leakage diagnostics
results with IPD ON
Channel leakage
diagnostics results with IPD
OFF
No Shorts
No Fault
No Fault
Short to battery
STB Fault
STB Fault
Loop to loop short
STG Fault
No Fault
Short to ground
STG Fault
STG Fault



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